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entries 1-1
1 Bestseller Advances in nanoengineering : electronics, materials, assembly London : Imperial College Press ; Singapore ; Hackensack, NJ : Distributed by World Scientific Pub., [2007] Rating: Electronic Resources More... Item Status
entries 2-55
2 Bestseller Redox polymers for energy and nanomedicine [Cambridge] : Royal Society of Chemistry, [2021] Rating: Electronic Resources More... Item Status
3 Bestseller Recent advancement in electronic devices, circuit and materials New York : Nova Science Publishers, Inc., 2020. Rating: Item Status
4 Bestseller Materials for electronics : silicon carbide and related materials : selected peer-reviewed papers fr Asia-Pacific Conference on Silicon Carbide and Related Materials (2nd : 2019 : Beijing, China) Zurich, Switzerland : TransTech, 2020. Rating: Electronic Resources More... Item Status
5 Bestseller Strontium titanate : synthesis, properties and uses Hauppauge, New York : Nova Science Publishers, Inc., [2019] Rating: Item Status
6 Bestseller Microelectronics failure analysis : desk reference Materials Park, Ohio : ASM International, [2019] Seventh edition. Rating: Electronic Resources More... Item Status
7 Bestseller ISTFA 2019. International Symposium for Testing and Failure Analysis. Materials Park : A S M International, 2019. Rating: Electronic Resources More... Item Status
8 Bestseller E-waste : regulations, management strategies and current issues New York : Nova Publishers, [2017] Rating: Electronic Resources More... Item Status
9 Bestseller Research and application of functional materials : ICSMR 2016 International Conference on Smart Materials Research (2nd : 2016 : Istanbul, Turkey) Zurich, Switzerland : Trans Tech Publications, [2017] Rating: Electronic Resources More... Item Status
10 Bestseller ISTFA 2017 : conference proceedings from the 43rd International Symposium for Testing and Failure An International Symposium for Testing and Failure Analysis (42nd : 2016 : Fort Worth, Tex.) Materials Park, Ohio : ASM International, [2017] Rating: Electronic Resources More... Item Status
11 Bestseller Robust design of digital circuits on foil Myny, Kris, 1980- author. Cambridge : Cambridge University Press, 2016. Rating: Electronic Resources More... Item Status
12 Bestseller Advanced functional materials : selected, peer reviewed papers from the Chinese Materials Congress 2 Chinese Materials Congress (2014 : Chengdu, China) Pfäffikon, Switzerland : Trans Tech Publications Ltd, 2015. Rating: Electronic Resources More... Item Status
13 Bestseller Emerging functional materials : advances in energy and environmental applications [Zurich], Switzerland : Trans Tech Publications, [2015] Rating: Electronic Resources More... Item Status
14 Bestseller Advances in applied materials and electronics engineering III : selected, peer reviewed papers from International Conference on Applied Materials and Electronics Engineering (AMEE 2014) (3rd : 2014 : Hong Kong, China) Durnten-Zurich : Trans Tech Publications Ltd., 2014. Rating: Electronic Resources More... Item Status
15 Bestseller Automatic control and mechatronic engineering III : selected, peer reviewed papers from the 3rd Inte International Conference on Automatic Control and Mechatronic Engineering (3rd : 2014 : Xiamen, China) Pfaffikon, Switzerland : Trans Tech Publications Ltd, [2014] Rating: Electronic Resources More... Item Status
16 Bestseller Recent engineering decisions in industry : selected, peer reviewed papers from the 2014 2nd Internat International Conference on Materials Science and Mechanical Engineering (2nd : 2014 : Taipei, Taiwan) Switzerland : Trans Tech Publications, 2014. Rating: Electronic Resources More... Item Status
17 Bestseller 6th Forum on New Materials : proceedings of the 6th Forum on New Materials, part of CIMTEC 2014-13th Forum on New Materials (6th : 2014 : Montecatini Terme, Italy) Switzerland : Trans Tech Publications Ltd., [2014] Rating: Electronic Resources More... Item Status
18 Bestseller Advances in functional and electronic materials : selected, peer reviewed papers from the Chinese Ma Chinese Materials Conference (2012 : Taiyuan, China) Durnten-Zurich, Switzerland : Trans Tech Publications, [2013] Rating: Electronic Resources More... Item Status
19 Bestseller Advances in applied materials and electronics engineering II : selected, peer reviewed papers from t Durnten-Zurich : Trans Tech Publications Ltd., [2013] Rating: Electronic Resources More... Item Status
20 Bestseller ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure An International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, Calif.) Materials Park, Ohio : ASM International, 2013. Rating: Electronic Resources More... Item Status
21 Bestseller Polymer electronics Geoghegan, Mark. Oxford : Oxford University Press, 2013. Rating: Electronic Resources More... Item Status
22 Bestseller Applied materials and electronics engineering : selected, peer reviewed papers from the 2012 Interna International Conference on Applied Materials and Electronics Engineering (2012 : Hong Kong, China) Durnten-Zurich, Switzerland : Trans Tech Publications, [2012] Rating: Electronic Resources More... Item Status
23 Bestseller Optical, electronic materials and applications II : selected, peer reviewed papers from the 2nd Inte International Conference on Optical, Electronic Materials and Applications (2nd : 2012 : Chongqing, China) Stafa-Zurich, Switzerland ; Enfield, NH : Trans Tech Publications, [2012] Rating: Electronic Resources More... Item Status
24 Bestseller Thick films : properties, technology, and applications New York : Nova Science Publishers, [2012] Rating: Electronic Resources More... Item Status
25 Bestseller ISTFA 2012 : conference proceedings from the 38th International Symposium for Testing and Failure An International Symposium for Testing and Failure Analysis (38th : 2012 : Phoenix Convention Center) Materials Park, Ohio : ASM International, 2012. Rating: Electronic Resources More... Item Status
26 Bestseller Microelectronics failure analysis : desk reference Materials Park, Ohio : ASM International, [2011] 6th ed. Rating: Electronic Resources More... Item Status
27 Bestseller ISTFA 2011 : conference proceedings from the 37th International Symposium for Testing and Failure An International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.) Materials Park, OH : ASM International, 2011. Rating: Electronic Resources More... Item Status
28 Bestseller Functional and electronic materials : selected, peer reviewed papers from IUMRS-ICA 2010, 11th IUMRS Durnten-Zurich, Switzerland : Trans Tech Publications, [2011] Rating: Electronic Resources More... Item Status
29 Bestseller New materials III : transparent conducting and semiconducting oxides, solid state lighting, novel su Forum on New Materials (5th : 2010 : Montecatini Terme, Italy), issuing body. Stafa-Zuerich ; Enfield, NH : Trans Tech Pubs. Ltd. on behalf of Techna Group, [2010] Rating: Electronic Resources More... Item Status
30 Bestseller Metamaterials : classes, properties and applications New York : Nova Science Publishers, [2010] Rating: Electronic Resources More... Item Status
31 Bestseller ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure An International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.) Materials Park, Ohio : ASM International, 2010. Rating: Electronic Resources More... Item Status
32 Bestseller Advances in electronic materials : special topic volume with invited papers only Stafa-Zurich ; U.K. : Trans Tech Publications, [2009] Rating: Electronic Resources More... Item Status
33 Bestseller Istfa 2009 : CONFERENCE PROCEEDINGS FROM THE 35TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE AN INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (35TH: 2009: SAN JOSE, CALIF.) MATERIALS PARK : ASM INTERNATIONAL, 2009. Rating: Electronic Resources More... Item Status
34 Bestseller ISTFA 2008 : conference proceedings of the 34th International Symposium for Testing and Failure Anal International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.) Materials Park, Ohio : ASM International, 2008. Rating: Electronic Resources More... Item Status
35 Bestseller The robot builder's cookbook Bishop, O. N. (Owen Neville) Amsterdam ; Boston ; London : Elsevier/Newnes, [2007] Rating: Electronic Resources More... Item Status
36 Bestseller ISTFA 2007 : proceedings of the 33rd International Symposium for Testing and Failure Analysis, Novem International Symposium for Testing and Failure Analysis (33rd : 2007 : San Jose, Calif.) Materials Park, OH : ASM International, [2007] Rating: Electronic Resources More... Item Status
37 Bestseller Polymers in electronics : market report Cousins, Keith. Shawbury, U.K. : Rapra, 2006. Rating: Electronic Resources More... Item Status
38 Bestseller ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, Novem International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.) Materials Park, OH : ASM International, 2006. Rating: Electronic Resources More... Item Status
39 Bestseller Electronic and optical properties of D-band perovskites Wolfram, Thomas, 1936- Cambridge, UK ; New York : Cambridge University Press, 2006. Rating: Electronic Resources More... Item Status
40 Bestseller ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movem International Symposium for Testing and Failure Analysis (31st : 2005 : San Jose, Calif.) Materials Park, OH : ASM International, [2005] Rating: Electronic Resources More... Item Status
41 Bestseller Microelectronics failure analysis : desk reference Materials Park, Ohio : ASM International, [2004] Rating: Electronic Resources More... Item Status
42 Bestseller Materials research to meet 21st century defense needs National Research Council (U.S.). Committee on Materials Research for Defense After Next. Washington, D.C. : National Academies Press, 2003. Rating: Electronic Resources More... Item Status
43 Bestseller ISTFA 2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 N International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.) Materials Park, Ohio : ASM International, 2003. Rating: Electronic Resources More... Item Status
44 Bestseller Microelectronic failure analysis : desk reference : 2002 supplement Materials Park, Ohio : ASM International, [2002] Rating: Electronic Resources More... Item Status
45 Bestseller Materials research to meet 21st century defense needs : interim report National Research Council (U.S.). Committee on Materials Research for Defense After Next. Washington, D.C. : National Academy Press, [2001] Rating: Electronic Resources More... Item Status
46 Bestseller Microelectronic failure analysis : desk reference : 2001 supplement Materials Park, OH : ASM International, [2001] Rating: Electronic Resources More... Item Status
47 Bestseller ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-1 International Symposium for Testing and Failure Analysis (27th : 2001 : Santa Clara, Calif.) Materials Park, OH : ASM International, [2001] Rating: Electronic Resources More... Item Status
48 Bestseller Silicides : fundamentals and applications : proceedings of the 16th Course of the International Scho International School of Solid State Physics (16th : 1999 : Erice, Italy) Singapore ; River Edge, NJ : World Scientific, [2000] Rating: Electronic Resources More... Item Status
49 Bestseller Hermeticity of electronic packages Greenhouse, Hal. Park Ridge, N.J. : Norwich, N.Y. : Noyes Publications, [2000] Rating: Electronic Resources More... Item Status
50 Bestseller Electric refractory materials New York : Marcel Dekker, [2000] Rating: Electronic Resources More... Item Status

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