entries 1-3
Newcastle upon Tyne : Cambridge Scholars Publishing, 2013.
Rating:
Springfield : Charles C Thomas Publisher, 2010.
Rating:
Washington, D.C. : National Academy Press, 1988.
Rating:
entries 4-7
Rothwell, William J., 1951-
New York : Amacom, [1996]
Rating:
Washington, D.C. : National Academy Press, 1994.
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Washington, D.C. : National Academy Press, 1991.
Rating:
Washington, D.C. : National Academy Press, 1991.
Rating:
entries 8-8
Burlington, VT : Ashgate Publishing Limited, [2014]
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entries 9-58
Charlotte, NC : Information Age Publishing, Inc., [2022]
Rating:
New York, NY : Oxford University Press, [2022]
Rating:
International Conference on Material Science and Engineering Technology (2012- ) (10th : 2021 : Online)
Baech, Switzerland : Scientific.Net : distributed worldwide by Trans Tech Publications Ltd, [2022]
Rating:
Dimitriadis, Nikolaos, author.
London, United Kingdom ; New York, NY : Kogan Page, 2021.
Second edition.
Rating:
DeMello, Margo.
New York : Columbia University Press, 2021.
Second edition.
Rating:
Ferguson, Duncan, author.
New York, New York (222 East 46th Street, New York, NY 10017) : Business Expert Press, 2021.
First edition.
Rating:
Martinez, Jesus.
Birmingham : Packt Publishing, Limited, 2021.
Rating:
Montreal ; Chicago : McGill-Queen's University Press, [2020]
Rating:
Chicago, IL : Health Administration Press ; Washington, DC : Association of University Programs in Health Administration, [2019]
Second edition.
Rating:
Zarka, Michel.
[Place of publication not identified] : INFORMATION AGE PUB, 2019.
Rating:
Clayton South, VIC : CSIRO Publishing, [2019]
Rating:
Newton, David E., author.
Santa Barbara, California : ABC-CLIO, an imprint of ABC-CLIO, LLC, [2018]
Second edition.
Rating:
Murray, Thomas H., 1946- author.
New York, NY : Oxford University Press, [2018]
Rating:
Buckley, M. Ronald.
Bingley : Emerald Publishing Limited, 2017.
Rating:
Wiley, R. Haven, author.
Cambridge, Massachusetts ; London, England : Harvard University Press, 2015.
Rating:
Ottawa : University of Ottawa Press, 2015.
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Bingley, U.K. : Emerald, 2015.
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Maringe, Felix.
Cape Town : African Minds, 2015.
Rating:
CSHI (Conference) (2015 : Curitiba, Brazil), author.
Amsterdam : IOS Press, [2015]
Rating:
New York : Nova Publishers, [2014]
Rating:
Cham ; New York : Springer, [2014]
Rating:
Kim, Mijung, author.
SensePublishers [Imprint], Jan. 2012. New York : Springer Palo Alto : Ebrary, Incorporated [distributor]
Rating:
New York, NY : Oxford University Press, [2012]
Rating:
Logan [Utah] : Utah State University Press, [2012]
Rating:
Berman, Barry.
Upper Saddle River, N.J. : FT Press, [2011]
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Washington, DC : National Academies Press, [2011?]
Rating:
NATO Advanced Research on Human Systems Integration to Enhance Maritime Domain Awareness for Port/Harbour Security Systems (2008 : Opatija, Croatia)
Amsterdam ; Washington, DC : IOS Press, [2010]
Rating:
Lumpkin, Angela.
Santa Barbara, Calif. : ABC-CLIO, [2009]
Rating:
International Conference on Software Technology and Engineering (2009 : Madras, India)
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., [2009]
Rating:
London : Imperial College Press ; Singapore : Distributed by World Scientific Pub. Co., [2009]
Rating:
Parker, Simon C.
Cambridge, UK ; New York : Cambridge University Press, 2009.
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Sparrow, Malcolm K.
Cambridge, UK ; New York : Cambridge University Press, 2008.
Rating:
Cambridge, UK ; New York : Cambridge University Press, 2008.
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McKenzie, Richard B., author.
Ann Arbor : University of Michigan Press, [2008]
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London ; Philadelphia : Jessica Kingsley Publishers, 2007.
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Hove [England] ; New York : Psychology Press, 2006.
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Asia-Pacific Bioinformatics Conference (4th : 2006 : Taipei, Taiwan)
London : Imperial College Press ; Hackensack, NJ : Distributed by World Scientific, [2006]
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Washington, D.C. : National Academies Press, [2006]
Rating:
Hoberman, John M. (John Milton), 1944-
Berkeley : University of California Press, [2005]
Rating:
Hoberman, John M. (John Milton), 1944-
Berkeley : University of California Press, [2005]
Rating:
Amsterdam ; Boston : Elsevier JAI, 2004.
1st ed.
Rating:
Amsterdam ; New York : Pergamon, 2000.
1st ed.
Rating:
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