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| entries 1-37 |
Ross, Frances M., 1964- author, editor.
New York, NY : Cambridge University Press, 2017.
Rating:
|
International Conference on Electron Microscopy (15th : 2014 : Kraków, Poland)
Zurich : Trans Tech Publishers, 2015.
Rating:
|
Glauert, Audrey M.
Princeton : Princeton University Press, 2014.
Rating:
|
Tishko, Tatyana.
Singapore ; Hackensack, NJ : World Scientific Publishing Co., [2011]
Rating:
|
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., [2008]
Rating:
|
International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.)
Materials Park, OH : ASM International, 2006.
Rating:
|
Dietrich, Jens.
London : Imperial College Press, [2005]
Rating:
|
International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.)
Materials Park, Ohio : ASM International, 2003.
Rating:
|
Oxford ; New York : Oxford University Press, 2001.
2nd ed.
Rating:
|
Cambridge ; New York : Cambridge University Press, 2000.
Rating:
|
Oxford, England ; New York : Oxford University Press, [1999]
2nd ed.
Rating:
|
Maunsbach, Arvid Bernhard.
San Diego, Calif. : Academic Press, [1999]
Rating:
|
Washington : Food and Drug Administration, Public Health Service, U.S. Dept. of Health and Human Services, 1981.
2nd ed.
Rating:
|
Bracegirdle, Brian.
Ithaca, N.Y. : Cornell University Press, 1978.
Rating:
|
Hicks, John W.
Washington : Federal Bureau of Investigation, FBI Laboratory, [1977]
Rating:
|
Berlyn, Graeme P., 1933-
Ames, Iowa : Iowa State University Press, 1976.
1st ed.
Rating:
|
Koehler, James K., 1933-
Berlin ; New York : Springer-Verlag, 1973-
Rating:
|
Gray, Peter, 1908-1981.
New York : Van Nostrand Reinhold, [1973]
Rating:
|
Glauert, Audrey M.
Amsterdam : North-Holland ; New York : American Elsevier, 1973-
Rating:
|
Hayat, M. A., 1940-
New York : Van Nostrand Reinhold Co., [1972]
Rating:
|
Mercer, E. H. (Edgar Howard), 1919-
Oxford : Blackwell Scientific, 1972.
3rd ed. -
Rating:
|
Grimstone, A. V.
Cambridge : University Press, 1972.
Rating:
|
Weakley, Brenda S.
Edinburgh : Churchill Livingstone, 1972.
Rating:
|
Dawes, Clinton J.
New York : Barnes & Noble, [1971]
Rating:
|
Sjöstrand, Fritiof S. (Fritiof Stig), 1912-
New York : Academic Press, 1967-
Rating:
|
Ivan Sorvall, Inc.
Norwalk, Conn., [publisher not identified], [1967]
2d. ed. with supp.
Rating:
|
Thompson, Samuel Wesley.
Springfield, Ill. : C.C. Thomas, [1966]
Rating:
|
Kay, Desmond.
Philadelphia : F.A. Davis Co., [1966]
2d ed.
Rating:
|
Galigher, Albert E. (Albert Edward), 1899-1960.
Philadelphia : Lea & Febiger, 1964.
Rating:
|
Pease, Daniel C. (Daniel Chapin), 1914-
New York : Academic Press, 1964.
2d ed.
Rating:
|
Jones, Arthur W.
Minneapolis : Burgess Pub. Co., 1960.
Rev. ed.
Rating:
|
Baker, John R. (John Randal), 1900-1984.
London : Methuen; New York : Wiley, [1958]
Rating:
|
Gray, Peter, 1908-1981.
New York : McGraw-Hill, 1958.
2d. ed.
Rating:
|
Sass, John E. (John Eugene), 1897-1971.
Ames : Iowa State College Press, [1958]
3d ed.
Rating:
|
Johansen, Donald Alexander, 1901-
New York ; London : McGraw-Hill, 1940.
1st ed.
Rating:
|
Chamberlain, Charles Joseph, 1863-1943.
Chicago, Ill. : The University of Chicago press, 1932.
5th rev. ed.
Rating:
|
Guyer, Michael F. (Michael Frederic), 1874-1959.
Chicago, Ill. : The University of Chicago press, [1930]
3d. ed.
Rating:
|
| entries 38-38 |
Burrells, W.
New York : Wiley, 1977.
New rev. ed.
Rating:
|
| entries 39-99 |
Singapore : Bentham Science Publishers Pte. Ltd., [2022]
Rating:
|
Nandi, Arun Kumar.
Cambridge : Royal Society of Chemistry, [2021]
Rating:
|
International Conference on Material Science and Engineering Technology (4th : 2020 : Fukuoka, Japan)
Switzerland : Trans Tech Publications Ltd, 2020.
Rating:
|
Muralisrinivasan, Subramanian, author.
[Place of publication not identified] : Momentum Press, 2019.
Rating:
|
London : Royal Society of Chemistry, [2019]
Rating:
|
[Place of publication not identified] : De Gruyter, [2019]
Rating:
|
Materials Park, Ohio : ASM International, [2019]
Seventh edition.
Rating:
|
New York : Nova Science Publishers, Incorporated, 2018.
Rating:
|
New York : Nova Science Publishers, [2018]
Rating:
|
Brazilian Ceramic Conference (59th : 2015 : Barra dos Coqueiros, Brazil)
Zurich, Switzerland : Trans Tech Publications, [2017]
Rating:
|
Hauppauge, N.Y. : Nova Science, 2016.
Rating:
|
Hauppauge, New York : Nova Science Publishers, Inc., [2016]
Rating:
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