|
entries 1-2 |
Amos, S. W. (Stanley William)
Oxford ; Boston : Newnes, 2000.
9th ed.
Rating:
|
Carroll, John M. (John Millar), 1925-2011.
New York : McGraw-Hill, 1959.
Rating:
|
entries 3-8 |
Fiore, James M.
Utica NY : James M. Fiore, [2018]-
Rating:
|
Sou, Antony, author.
Shawbury, Shrewsbury, Shropshire : A Smithers Group Company, 2016.
Rating:
|
Feucht, Dennis.
Raleigh, NC : SciTech Pub., [2010]
Rating:
|
Levinshteĭn, M. E. (Mikhail Efimovich)
Singapore ; River Edge, N.J. : World Scientific, [1998]
Rating:
|
Siliconix Incorporated.
New York : McGraw-Hill, [1981]
Rating:
|
Riddle, Robert L.
Englewood Cliffs, N.J. : Prentice-Hall, 1958.
Rating:
|
entries 9-9 |
Sweet, Allen A., 1943-
Boston, MA : Artech House, [2008]
Rating:
|
entries 10-65 |
Miller, Chris (Research fellow), author.
New York : Scribner, an imprint of Simon & Schuster, 2022.
First Scribner hardcover edition.
Rating:
|
Sahrling, Mikael, 1964- author.
[Place of publication not identified] : Artech House, 2022.
Rating:
|
Yu, Hao, author.
Stevenage Institution of Engineering & Technology 2021.
Rating:
|
Del Corso, Dante, 1946- author.
Boston Artech House [2020]
Rating:
|
London, United Kingdom : The Institution of Engineering and Technology, 2020.
Rating:
|
Senani, Raj, author.
Stevenage Institution of Engineering and Technology 2020.
Rating:
|
Alencar, Marcelo S., 1957-
Denmark : River Publishers, [2020]
Rating:
|
Edwards, T. C. (Terence Charles), author.
Boston : Artech House, [2018]
Rating:
|
Denmark : River Publishers, [2018]
Rating:
|
Aalborg, Denmark : River Publishers, [2018]
Rating:
|
Hoffman, Jon, author.
Birmingham : Packt Publishing Ltd, 2018.
Rating:
|
Belous, A. I. (Anatoliĭ Ivanovich), author.
Norwood : Artech House, 2017.
Rating:
|
Rashid, Muhammad H.
Saint Louis : Elsevier Science, 2017.
4th ed.
Rating:
|
Hauppauge, New York : Nova Science Publishers, Inc., [2016]
Rating:
|
Berlin, GERMANY : De Gruyter Oldenbourg, 2016.
Rating:
|
London, United Kingdom : The Institution of Engineering and Technology, [2016]
Rating:
|
Stevenage : IET, 2016.
Rating:
|
Myny, Kris, 1980- author.
Cambridge : Cambridge University Press, 2016.
Rating:
|
Maloberti, F. (Franco)
Aalborg : River Publishers, 2016.
Rating:
|
Hauppauge, New York : Nova Science Publisher's, Inc., [2015]
Rating:
|
[San Francisco, California, USA] : Kanopy Streaming, 2014.
Rating:
|
Hauppauge, New York : Nova Science Publisher's, Inc., [2014]
Rating:
|
Bahl, Inder J.
Norwood : Artech House, 2014.
Rating:
|
Chappell, Paul H., author.
Boston, MA : Artech House, [2014]
Rating:
|
Singapore : World Scientific Pub. Co., 2013.
Rating:
|
Xia, Jianbai, 1939-
Singapore : World Scientific, 2012.
Rating:
|
Aluf, Ofer.
Singapore ; Hackensack, NJ : World Scientific Publishing Co., [2012]
Rating:
|
Karris, Steven T.
Fremont, California, USA : Orchard Publications, 2012.
3rd ed.
Rating:
|
New York : Nova Science Publishers, [2012]
Rating:
|
International Symposium for Testing and Failure Analysis (38th : 2012 : Phoenix Convention Center)
Materials Park, Ohio : ASM International, 2012.
Rating:
|
[New York, N.Y.] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2011.
1st ed.
Rating:
|
Burlington, MA : Butterworth-Heinemann, [2011]
3rd ed.
Rating:
|
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., [2010]
Rating:
|
Ghallab, Yehya H.
Norwood, Mass. : Artech House, [2010]
Rating:
|
Durrani, Zahid Ali Khan.
London : Imperial College Press, [2010]
Rating:
|
Hauppauge, N.Y. : Nova Science Publishers, [2010]
Rating:
|
Workshop on Frontiers in Electronics (5th : 2007 : Cozumel, Mexico)
Singapore : World Scientific Pub. Co., [2009]
Rating:
|
Bowick, Chris.
Amsterdam ; Boston : Newnes/Elsevier, [2008]
2nd ed.
Rating:
|
Kroemer, Herbert, 1928-
Singapore : World Scientific, [2008]
Rating:
|
Arora, N. (Narain), 1943-
New Jersey : World Scientific, [2007]
Rating:
|
Rodriguez-Villegas, Esther.
Stevenage : Institution of Engineering and Technology, 2006.
Rating:
|
|