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Conference International Symposium on Educational Testing (3rd : 1977 : Leiden, Netherlands)

Title Psychometrics for educational debates / edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N.M. de Gruijter.

Publication Info. Chichester ; New York : Wiley, [1980]
©1980

Item Status

Location Call No. Status OPAC Message Public Note Gift Note
 Moore Stacks  LB3051 .I515 1977    Available  ---
Description x, 337 pages : illustrations ; 24 cm
Note "Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."
Bibliography Includes bibliographies and indexes.
Subject Educational tests and measurements -- Congresses.
Educational tests and measurements.
Tests et mesures en éducation -- Congrès.
Intelligentietests.
Examens.
Genre/Form Conference papers and proceedings.
Conference papers and proceedings.
Added Author Kamp, Leo J. Th. van der.
Langerak, Willem F.
Gruijter, Dato N. de.
ISBN 0471275964