Skip to content
Rider Library Catalog
You are not logged in
|
Login
Your session will expire automatically in
0
seconds.
Continue session
End session now
Request
Add to My Lists
Export
MARC Display
SearchType
Keyword
Author
Title
Journal Title
Series Title
Subject
Genre
Call no.
ISBN / ISSN
Table of Contents
Publisher
Prof/TA
Course
Search
Search Scope
View Entire Collection
Moore Library
Talbott Library
Limit search to available items
(Search History)
Author: Kamp, Leo J. Th. van der in View Entire Collection
(Clear Search History)
(End Search Session)
Search history function requires JavaScript.
Record:  
Prev
Next
Resources
More Information
Book
Conference
International Symposium on Educational Testing (3rd : 1977 : Leiden, Netherlands)
Title
Psychometrics for educational debates / edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N.M. de Gruijter.
Publication Info.
Chichester ; New York : Wiley, [1980]
©1980
Item Status
Location
Call No.
Status
OPAC Message
Public Note
Gift Note
Moore Stacks
LB3051 .I515 1977
Available
---
Description
x, 337 pages : illustrations ; 24 cm
Note
"Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."
Bibliography
Includes bibliographies and indexes.
Subject
Educational tests and measurements -- Congresses.
Educational tests and measurements.
Tests et mesures en éducation -- Congrès.
Intelligentietests.
Examens.
Genre/Form
Conference papers and proceedings.
Conference papers and proceedings.
Added Author
Kamp, Leo J. Th. van der.
Langerak, Willem F.
Gruijter, Dato N. de.
ISBN
0471275964