Description |
1 online resource (xxii, 343 pages) : illustrations (some color) |
Physical Medium |
polychrome |
Description |
text file |
Bibliography |
Includes bibliographical references (pages 291-315) and index. |
Contents |
Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges. |
Summary |
There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients. The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike. |
Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
Subject |
Soft errors (Computer science)
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Soft errors (Computer science) |
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Semiconductor storage devices.
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Semiconductor storage devices. |
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Neutron irradiation.
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Neutron irradiation. |
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Radiation dosimetry.
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Radiation dosimetry. |
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Nuclear physics.
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Nuclear physics. |
Genre/Form |
Electronic books.
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Electronic books.
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Added Author |
Nakamura, Takashi, 1939-
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Other Form: |
Print version: Terrestrial neutron-induced soft errors in advanced memory devices. Hackensack, NJ : World Scientific, ©2008 9789812778819 9812778810 (DLC) 2008298667 (OCoLC)185032763 |
ISBN |
9789812778826 (electronic book) |
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9812778829 (electronic book) |
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1281930059 |
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9781281930057 |
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9789812778819 |
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9812778810 |
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