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Title Terrestrial neutron-induced soft errors in advanced memory devices / Takashi Nakamura [and others].

Publication Info. Hackensack, NJ : World Scientific, [2008]
©2008

Item Status

Description 1 online resource (xxii, 343 pages) : illustrations (some color)
Physical Medium polychrome
Description text file
Bibliography Includes bibliographical references (pages 291-315) and index.
Contents Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.
Summary There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients. The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Soft errors (Computer science)
Soft errors (Computer science)
Semiconductor storage devices.
Semiconductor storage devices.
Neutron irradiation.
Neutron irradiation.
Radiation dosimetry.
Radiation dosimetry.
Nuclear physics.
Nuclear physics.
Genre/Form Electronic books.
Electronic books.
Added Author Nakamura, Takashi, 1939-
Other Form: Print version: Terrestrial neutron-induced soft errors in advanced memory devices. Hackensack, NJ : World Scientific, ©2008 9789812778819 9812778810 (DLC) 2008298667 (OCoLC)185032763
ISBN 9789812778826 (electronic book)
9812778829 (electronic book)
1281930059
9781281930057
9789812778819
9812778810