entries 29-158
Westport, Conn. : Bergin & Garvey, 1995.
Rating:
Clines, David J. A.
Sheffield, England : Sheffield Academic Press, [1995]
Rating:
Cambridge, Mass. : Harvard Educational Review, [1992]
Rating:
Bell, John L. (John Lamberton), 1949-
Chicago : GIA Publications, [1992]
Rating:
Talbott: Circulating Collection
M2065 .B45 I5
Available
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Talbott Wasson Collection
M2065.B45 I5
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De la Mothe, John.
Montreal [Que.] : McGill-Queen's University Press, [1992]
Rating:
Knapp, Bettina Liebowitz, 1926-2010.
University Park, Pa. : Pennsylvania State University Press, [1991]
Rating:
University, Ala. : University of Alabama Press, [1984]
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New York : St Martin's Press, 1965 [that is, 1966, c1965]
Rating:
entries 159-162
Macdonald, Dwight.
New York : New York Review Books, [2011]
Rating:
Weir, David, 1947 April 20-
Albany : State University of New York Press, [2008]
Rating:
Weir, David, 1947 April 20-
Albany : State University of New York Press, [2008]
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Macdonald, Dwight.
New York : Random House, 1962.
Rating:
entries 163-205
Seattle : University of Washington Press, [2022]
Rating:
Dinita, Alin.
Zurich : Trans Tech Publications, Limited, 2021.
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Singapore : Bentham Science Publishers, 2020.
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Zumthurm, Tizian, author.
Leiden ; Boston : Brill 2020.
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Seattle : University of Washington Press, [2019]
First edition.
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Baltimore, Maryland : Project Muse, 2019.
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Johannesburg : Wits University Press, 2018.
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Ling, Mengchu, 1580-1644, author.
Seattle : University of Washington Press, [2018]
Rating:
International Conference on Structural and Mechanical Engineering for Security and Prevention (2017 : Prague)
Zurich : TTP, [2017]
Rating:
Senelick, Laurence, author.
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2017.
Rating:
Logan : Utah State University Press, 2016.
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King, Richard H., author.
Chicago ; London : University of Chicago Press, 2015.
Rating:
Kahan, Alan S.
Indianapolis : Liberty Fund, [2015]
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International Conference on Diffusion in Materials (2014 : Münster, Germany)
Pfaffikon, Switzerland : Trans Tech Publications, 2015.
Rating:
Leiden : Brill, [2015]
Rating:
Zhu, Rongji, 1928- author.
[Place of publication not identified] : [publisher not identified], 2015.
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New York, NY : Oxford University Press, 2015.
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Shteyngart, Gary, 1972-
New York : Random House, [2014]
First edition.
Rating:
New York, NY : Library of America ; Distributed to the trade in the United States by Penguin Random House Inc., [2014]
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Fairchild, B. H., author.
New York ; London : W. W. Norton & Company, Inc., [2014]
First edition.
Rating:
Doh, Emmanuel Fru, author.
Baltimore, Maryland : Project Muse, 2014.
Rating:
Armonk, NY : Sharpe Reference, 2005.
[Enhanced Credo edition].
Rating:
Armonk, NY : Sharpe Reference, 2005.
[Enhanced Credo edition]
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Jacquette, Dale.
London : Routledge, Taylor and Francis, 2014.
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Kinsella, John, 1963-
Athens : Swallow Press/Ohio University Press, [2012]
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International Conference on Geotechnical Engineering for Disaster Mitigation and Rehabilitation (3rd : 2011)
Singapore ; Hackensack, NJ : World Scientific, [2011]
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Lanham, Md. : Lexington Books, 2010.
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[New York] : Library of America, [2009]
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International Conference on Environmental, Industrial and Applied Microbiology (2nd : 2007 : Seville, Spain)
Hackensack, NJ : World Scientific, [2009]
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Coastal Dynamics (Conference) (6th : 2009 : Tokyo, Japan)
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., [2009]
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Nabhan, Gary Paul.
Washington, DC : Island Press/Shearwater Books, [2009]
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Boston : Department for Jewish Zionist Education ; Brighton, Mass. : Academic Studies Press, 2008.
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Gaĭdar, E. T. (Egor Timurovich)
Washington, D.C. : Brookings Institution Press, [2007]
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Gaĭdar, E. T. (Egor Timurovich), author.
Washington, D.C. : Brookings Institution Press, [2007]
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International Symposium on Nitrides (5th : 2006 : Eskişehir, Turkey)
Zurich : Trans Tech Publications, 2007.
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Clarke, David J. (David James), 1954-
Hong Kong : Hong Kong University Press, [2002]
Rating:
Core, John, 1951-
Colfax, N. Carolina : Wayne Leupold Editions, [2000]
Rating:
Talbott Wasson Collection
BV459 .C67 2000
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Seattle : University of Washington Press, [2000]
Rating:
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