entries 60-225
Bingley, England : Emerald, 2014.
Rating:
Amsterdam : IOS Press, 2014.
Rating:
United States. Congress. House. Committee on Foreign Affairs. Subcommittee on Europe, Eurasia, and Emerging Threats.
[Washington, D.C.] : U.S. Government Printing Office, [2013]
Rating:
Hemann, Chuck.
Indianapolis, Ind. : Que, [2013]
Rating:
R. Patil, Manoj.
Birmingham, UK : Packt Publishing, 2013.
Rating:
Roberts, Dale, 1963-
Burlington, VT : Gower, [2013]
Rating:
Springfield, Ill. : Charles C Thomas, [2013]
Rating:
Shaw, Kenneth A. (Kenneth Alan), 1941- author.
New York, New York (222 East 46th Street, New York, NY 10017) : Business Expert Press, 2013.
First edition.
Rating:
Bosco, Robert J.
Birmingham, UK : Packt Publishing, 2013.
Rating:
Lidberg, Simon, author.
Birmingham : Packt Publishing, 2013.
Rating:
Sheikh, Nauman Mansoor.
Burlington : Elsevier Science, 2013.
Rating:
Adams, Ian, author.
Australia : Fontaine Publishing Group, [2013]
Rating:
Krishnaswamy, Jayaram.
Birmingham : Packt Pub., 2013.
2nd ed.
Rating:
Xavier, Manuel.
Birmingham : Packt Publishing, 2013.
Rating:
Studebaker, David A.
Birmingham : Packt Pub., 2013.
Rating:
Lorente, Laura Nicolàs.
Birmingham : Packt Pub., 2013.
Rating:
Redmond, Stephen (Information technologist)
Birmingham : Packt Pub., 2013.
Rating:
Fife, Murray.
Birmingham : Packt Publishing, 2013.
Rating:
Amer, Mohamed.
Birmingham : Packt Publishing, 2013.
Rating:
Lorente, Cristina Nicolàs.
Birmingham, UK : Packt Pub., 2013.
Rating:
Khabeer, Quazi, author.
Oxford, U.K. : Alpha Science Internation Limited, 2013.
Rating:
International Conference on Quantitative Logic and Soft Computing (3rd : 2012 : Xi'an, China)
Singapore : World Scientific, 2012.
Rating:
Lubbers, Eveline.
London : Pluto Press ; New York : Distributed in the U.S.A. exclusively by Palgrave Macmillan, 2012.
Rating:
Brizzi, Learco.
Birmingham, UK : Packt Pub., 2012.
Rating:
Amsterdam : Academic Press, 2012.
1st ed.
Rating:
International Conference on Information Technology for Manufacturing Systems (2011 : Shanghai, China)
Stafa-Zurich ; Enfield, NH : Trans Tech Publications, [2011]
Rating:
Mendell, Ronald L.
Springfield : Charles C Thomas Publisher, 2011.
2nd ed.
Rating:
New Delhi, India ; Thousand Oaks, Calif. : Response Books, 2011.
Rating:
Jayanty, Satya Shyam K.
Birmingham : Packt Pub., 2011.
Rating:
Amsterdam ; Boston : Morgan Kaufmann Publishers, [2011]
5th ed.
Rating:
Arlington, Virginia : Saylor Academy, 2011-
Rating:
Earnest, Peter.
New York : AMACOM/American Management Association, [2011]
Rating:
Jelen, Bill.
Uniontown, Ohio : Holy Macro! Books, [2010]
Rating:
Riaz, Ned.
Birmingham, U.K. : Packt Pub., 2009.
Rating:
McDowell, Don, 1939-
Lanham, Md. : Scarecrow Press, 2009.
Rev. ed.
Rating:
Snow, Bonnie.
New York : Neal-Schuman Publishers, [2008]
3rd ed.
Rating:
London ; Ann Arbor, MI : Pluto Press, 2007.
Rating:
Betz, Charles T.
Amsterdam ; Boston : Elsevier/Morgan Kaufmann, [2007]
Rating:
Hall, Chris, Dr.
Singapore : World Scientific Pub. Co., [2007]
Rating:
Krishnaswamy, Jayaram.
Birmingham, U.K. : Packt Pub., [2007]
Rating:
Howson, Peter, 1957-
Aldershot, Hants, England ; Burlington, VT : Gower, [2006]
Rating:
Winkler, Ira.
Indianapolis, IN : Wiley Pub., [2005]
Rating:
Nasheri, Hedieh.
Cambridge, UK ; New York : Cambridge University Press, 2005.
Rating:
Amsterdam ; Boston, Mass. : Elsevier, [2005]
Rating:
Murphy, Christopher.
Aldershot, England ; Burlington, VT : Gower, [2005]
Rating:
Nasheri, Hedieh.
Cambridge, UK ; New York : Cambridge University Press, 2005.
Rating:
Mason, Ohio : Thomson/Texere, c2004.
Rating:
Ben-Atar, Doron S.
New Haven, CT : Yale University Press, 2004.
Rating:
Hurd, Mark.
Princeton : Bloomberg Press, [2004]
1st ed.
Rating:
Singapore ; River Edge, N.J. : World Scientific, [2004]
Rating:
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