New York : Cambridge University Press, 2015.
Rating:
Boston, MA : Harvard Business School Press, [2004]
Rating:
Albright, David.
New York, NY : Free Press, 2010.
1st Free Press hardcover ed.
Rating:
Kelly, John E., III (John Edward), 1954- author.
New York, NY : Columbia Business School Publishing, [2013]
Rating:
Jelen, Bill.
Uniontown, Ohio : Holy Macro! Books, [2010]
Rating:
Collie, Rob, author.
Merritt Island FL, USA : Holy Macro! Books, [2016]
2nd edition.
Rating:
Milligan, Joshua N., author.
Birmingham : Packt Publishing [2020]
Fourth edition.
Rating:
Greg Deckler, Deckler
Packt Publishing 2021.
Rating:
Leibzon, Alexander.
Birmingham : Packt Publishing Ltd, 2018.
Rating:
Collie, Rob, author.
Uniontown, Ohio : Holy Macro!, ©2014.
Rating:
Amsterdamn ; Philadelphia, PA : John Benjamins Pub. Co., [2010]
Rating:
Washington, D.C. : The National Academies Press, [2017]
Rating:
Chopra, Rohan, author.
Birmingham, UK : Packt Publishing, 2020.
Rating:
Peters, Benjamin, 1980- author.
Cambridge, Massachusetts : The MIT Press, [2016]
Rating:
United States. Congress. House. Committee on Small Business, author.
Washington : U.S. Government Printing Office, 2012.
Rating:
United States. Congress. House. Committee on Small Business, author.
Washington : U.S. Government Printing Office, 2012.
Rating:
Crane, Robert.
Birmingham : Packt Publishing, 2012.
Rating:
Lanza, Sheri R., 1955-
Medford, N.J. : CyberAge Books, [2001]
Rating:
Indianapolis, IN : Wiley Pub., [2008]
Rating:
Lavin, Jim.
Birmingham, UK : Packt Pub., 2014.
Rating:
Sales, Michael, author.
London ; Philadelphia : Kogan Page, 2016.
Rating:
Cambridge, Mass. : MIT Press, [1987]
Rating:
Erbschloe, Michael, 1951-
Amsterdam ; Boston : Elsevier Digital Press, [2005]
Rating:
Davos Platz, Switzerland : AO Foundation, [2018]
Rating:
United States. Congress. House. Committee on Financial Services. Subcommittee on Capital Markets, author.
Washington : U.S. Government Publishing Office, 2023.
Rating:
International Forum on Materials Science and Industrial Technology (2013 : Qingdao, China)
Durnten-Zurich, Switzerland : Trans Tech Publications, [2013]
Rating:
Manzuik, Steve.
Rockland, Mass. : Syngress Pub. ; Sebastopol, Calif. : O'Reilly Media [distributor], [2007]
Rating:
Birmingham, U.K. : Packt Pub., [2009]
Rating:
Vasiliev, Yuli.
Birmingham, U.K. : Packt Pub., [2007]
Rating:
International Conference on Manufacturing Science and Technology (2011 : Singapore)
Durnten-Zurich, Switzerland : Trans Tech Publications, [2012]
Rating:
Washington, DC : National Academies Press, [2007]
Rating:
Winkler, J. R. (Joachim R.)
Burlington, MA : Elsevier, 2011.
Rating:
Coyne, Richard, author.
Cambridge, Massachusetts ; London, England : The MIT Press, [2016]
Rating:
Kishor, Nand.
Stevenage : Institution of Engineering & Technology, 2020.
Rating:
Neural Computation and Psychology Workshop (9th : 2004 : Plymouth, England)
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., [2005]
Rating:
Toroman, Mustafa.
Birmingham : Packt Publishing Ltd, 2019.
Rating:
Fair, Ted.
Rockland, MA : Syngress Pub., [2005]
Rating:
Pascual, Jara, author.
Berlin ; Boston : De Gruyter, [2021]
Rating:
Washington, DC : The National Academies Press, [2022]
Rating:
McDowell, Don, 1939-
Lanham, Md. : Scarecrow Press, 2009.
Rev. ed.
Rating:
West Lafayette, Ind. : Purdue University Press, c2005.
Rating:
Rockland, MA : Syngress ; [Sebastopol, Calif.] : Distributed by O'Reilly Media in the United States and Canada, [2005]
Rating:
London, UK : Imperial College Press, [2014]
Rating:
Burlington, MA : Syngress, [2007]
Rating:
Price, David H., 1960- author.
Durham : Duke University Press, 2016.
Rating:
Gregory, Vicki L., 1950-
Englewood, Colo. : Libraries Unlimited, 1999.
Rating:
Yu, Zhenwei.
London : Imperial College Press ; Singapore ; Hackensack, NJ : Distributed by World Scientific Pub. Co., [2011]
Rating:
Hoboken, New Jersey : Wiley, 2010.
Revised and updated edition.
Rating:
Heemskerk, Eelke M. (Eelke Michiel)
Amsterdam : Amsterdam University Press, [2007]
Rating:
Simon, Alan, 1958-
San Francisco : Morgan Kaufmann, [2001]
Rating:
Save Marked Records