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| entries 1-66 |
Ojha, Ishwer C.
Boston : Beacon Press, [1969]
Rating:
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Lall, Arthur S. (Arthur Samuel), 1911-1998.
New York : Columbia University Press, 1968.
Rating:
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Neuhauser, Charles.
Cambridge : Published by East Asian Research Center, Harvard University : distributed by Harvard University Press, 1968.
Rating:
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Hensman, C. R.
Philadelphia : Westminster Press, [1968]
Rating:
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[Ann Arbor] : [Center for Chinese Studies, University of Michigan], 1968.
Rating:
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[Washington, D.C.] : Central Intelligence Agency, Directorate of Intelligence, 1968.
Rating:
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[Washington, D.C.] : Central Intelligence Agency, Directorate of Intelligence, 1968.
Rating:
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Cohen, Arthur A., author.
[Washington, D.C.] : Central Intelligence Agency, Directorate of Intelligence, 1968.
Rating:
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Williamsburg, Va. : College of William and Mary, 1967.
Rating:
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Hinton, Harold C.
New York : Houghton Mifflin, [1966]
Rating:
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Halpern, Abraham M. (Abraham Meyer), 1914-1985.
New York : Published for the Council on Foreign Relations by McGraw-Hill, [1965]
[1st ed.].
Rating:
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Boyd, R. G.
New York : Praeger, 1962.
Rating:
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Barnett, A. Doak.
[New York] : Published for the Council on Foreign Relations by Harper, 1960.
[1st ed.
Rating:
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Tang, Shenghe.
New York : F. A. Praeger, [1957]
Rating:
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Kuo, P. C. (Ping-chia)
New York : Knopf, 1956.
[1st ed.]
Rating:
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Levi, Werner, 1912-2005.
Minneapolis : University of Minnesota Press, [1953]
Rating:
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| entries 67-112 |
Madan, Tanvi, author.
Washington, D.C. : Brookings Institution Press, [2020]
Rating:
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Shaw, Yu-ming.
[Place of publication not identified] : Brill Academic Publishers : Brill, 2020.
Rating:
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PANG, YANG HUEI.
[Place of publication not identified] : HONG KONG UNIV Press, 2019.
Rating:
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Collins, Neil.
Manchester : Manchester University Press, 2012.
Rating:
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Hardacre, Helen, 1949-
New York : Oxford University Press, [2017]
Rating:
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Harold, Scott Warren, author.
Santa Monica, Calif. : RAND, [2016]
Rating:
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Wang, Jianlang (Historian), author.
Honolulu, HI : Silkroad Press, [2016]
Rating:
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Menon, Shivshankar, 1949- author.
Washington, D.C. : Brookings Institution Press, 2016.
Rating:
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Sullivan, Lawrence R., author.
Lanham, Maryland : Rowman and Littlefield, [2016]
Third edition.
Rating:
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King, Amy, 1982- author.
Cambridge : Cambridge University Press, 2016.
Rating:
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Halsey, Stephen R., 1975- author.
Cambridge, Massachusetts : Harvard University Press, 2015.
Rating:
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Stanford, California : Stanford University Press, [2015]
Rating:
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Mao, Joyce, author.
Chicago ; London : The University of Chicago Press, 2015.
Rating:
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Finkelstein, David, author.
Annapolis : Naval Institute Press, 2014.
Rating:
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Murfett, Malcolm H.
New York : Naval Institute Press, 2014.
Rating:
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Schott, Jeffrey J., 1949-
Washington, DC : Peterson Institute For International Economics, 2012.
Rating:
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[Reading, U.K.] : Paths International ; [Beijing, China] : Social Sciences Academic Press, [2012]
Rating:
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Lee, Ann (Economist)
San Francisco : Berrett-Koehler Publishers, [2012]
1st ed.
Rating:
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Gabaccia, Donna R., 1949-
Princeton, N.J. : Princeton University Press, 2012.
Rating:
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Newcastle upon Tyne : Cambridge Scholars Pub., 2011.
Rating:
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Zheng, Yushuo, 1949-
Chicago : City University of Hong Kong Press, 2011.
Rating:
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Durham [NC] : Duke University Press, 2010.
Rating:
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Huang, Jing, 1956-
Singapore : World Scientific, [2010]
Rating:
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Lanham : Lexington Books, [2010]
Rating:
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Lanham : Lexington Books, [2010]
Rating:
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Lanham, Md. : Rowman & Littlefield Publishers, [2010]
Rating:
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Ropp, Paul S., 1944-
Oxford : Oxford University Press, USA, 2010.
Rating:
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Clegg, Jenny.
London ; New York : Pluto Press ; New York : Distributed in the United States of America exclusively by Palgrave Macmillan, 2009.
Rating:
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Clegg, Jenny.
London ; New York : Pluto Press ; New York : Distributed in the United States of America exclusively by Palgrave Macmillan, 2009.
Rating:
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Beisner, Robert L.
Oxford ; New York : Oxford University Press, 2006.
Rating:
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Xia, Yafeng, 1965-
Bloomington : Indiana University Press, [2006]
Rating:
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London ; New York : Routledge, 2006.
Rating:
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Tokyo ; New York : United Nations University Press, [2005]
Rating:
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O'Brien, Neil L.
New York : Routledge, 2003.
Rating:
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