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| entries 74-528 |
Malden, MA : Blackwell Pub., 2005.
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Bowler, Peter J.
Chicago : University of Chicago Press, [2005]
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[United States] : Ellipsis Arts, [2005]
Special ed.
Rating:
| Talbott Media
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CD 8427v |
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| Talbott Media
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CD 8427v Booklet. |
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Bernardi, Giorgio.
Amsterdam ; Boston : Elsevier, 2005.
1st ed.
Rating:
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Hoffecker, John F.
New Brunswick, N.J. : Rutgers University Press, [2005]
Rating:
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Harrison, Linden T.
Amsterdam ; New York : Newnes, [2005]
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Arndt, Richard T., 1928-
Dulles, Va. : Potomac Books, 2005.
1st ed.
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Bailey, Adrian.
London : Hodder Arnold ; New York : Distributed in the United States of America by Oxford University Press, 2005.
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Cambridge ; New York : Cambridge University Press, 2005.
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New York, NY : G. Schirmer ; Milwaukee, WI : Distributed by Hal Leonard, [1991]
Rating:
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b13383905 v.2 |
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| Talbott: Circulating Collection
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M1619.F57 H37 v.1 |
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Fleissner, Jennifer (Jennifer L.)
Chicago : University of Chicago, [2004]
Rating:
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Turner, Alan, 1947-
New York : Columbia University Press, [2004]
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Rogers, John J. W. (John James William), 1930-2015.
New York : Oxford University Press, 2004.
Rating:
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International Conference on Quantum Information and Complexity (6th : 2003 : Meijo University)
Singapore ; Hackensack, NJ : World Scientific, [2004]
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Albany : State University of New York Press, [2004]
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Burlington, MA : Elsevier, [2004]
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Coffey, William, 1948-
River Edge, NJ : World Scientific, [2004]
2nd ed.
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New York : Routledge, 2004.
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Harms, William F.
Cambridge, UK ; New York : Cambridge University Press, 2004.
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Boulder, Colo. : Westview, 2003.
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International Workshop on the Identification of Dark Matter (4th : 2002 : York, England)
River Edge, NJ : World Scientific, [2003]
Rating:
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Bouchaud, Jean-Philippe, 1962- author.
Cambridge : Cambridge University Press, 2003.
Second edition.
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London ; New York : RoutledgeFalmer, 2003.
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London ; Portland, OR : Frank Cass, 2003.
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Nelis, Thomas.
Cambridge : Royal Society of Chemistry, [2003]
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Berlin ; New York : Mouton de Gruyter, 2002.
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Khalaf, Samir.
New York : Columbia University Press, 2002.
Rating:
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International Workshop on Technique and Application of Xenon Detectors (1st : 2001 : Tokyo, Japan)
River Edge, NJ : World Scientific, [2002]
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Westport, Conn. : Praeger, [2002]
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Cohen, Stephen P., 1936-
Washington, D.C. : Brookings Institution Press, 2002.
1st softcover ed.
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Mack, Stephen John, 1952-
Iowa City : University of Iowa Press, [2002]
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Kagarlitsky, Boris, 1958-
London ; Sterling, Va. : Pluto Press, 2002.
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Tanaka, Hiroshi.
River Edge, N.J. : World Scientific, [2002]
Rating:
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International Conference on Advanced Technology and Particle Physics (7th : 2001 : Como, Italy)
River Edge, NJ : World Scientific, [2002]
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Birner, Jack, 1951-
London ; New York : Routledge, 2002.
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New York : Routledge, 2002.
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Hebb, D. O. (Donald Olding)
Mahwah, N.J. : L. Erlbaum Associates, [2002]
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Jager, Ronald Burke.
London : Routledge, [2000, 1972]
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Berman, Ronald.
Tuscaloosa : University of Alabama Press, [2001]
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Hurd, Barbara.
Boston : Beacon Press, [2001]
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Hanson, Victor Davis.
New York : Doubleday, 2001.
1st ed.
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Squires, G. L. (Gordon Leslie)
Cambridge ; New York : Cambridge University Press, 2001.
4th ed.
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Westport, Conn. : Bergin & Garvey, 2001.
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Kosky, Jeffrey L.
Bloomington : Indiana University Press, [2001]
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Gordon, Lincoln.
Washington, D.C. : Brookings Institution Press, [2001]
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Hubbell, Stephen P., 1942-
Princeton : Princeton University Press, 2001.
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Mamontov, Yevgeny, 1955-
Singapore ; River Edge, NJ : World Scientific, 2001.
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Campbell, Wallace H. (Wallace Hall), 1926-
San Diego : Harcourt/Academic Press, [2001]
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Berman, Ronald.
Tuscaloosa : University of Alabama Press, [2001]
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Della Paolera, Gerardo, 1959-
Chicago : University of Chicago Press, 2001.
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