Keane, John, 1949-
Cambridge ; New York : Cambridge University Press, 2013.
Rating:
Jin, Dal Yong, 1964- author.
Urbana, Chicago : University of Illinois Press, [2016]
Rating:
New York : Oxford University Press, [2013]
Rating:
Hoboken, NJ : Wiley Blackwell, 2018.
Rating:
Pasadena, Calif. : Salem Press, [2014]
Rating:
Wurtzler, Steve J.
New York : Columbia University Press, [2007]
Rating:
Ndalianis, Angela, 1960-
Cambridge, Mass. : MIT Press, [2004]
Rating:
Lai, James S. (James Siu-Fong), 1968- author.
Philadelphia : Temple University Press, 2022.
Rating:
New York : Berghahn Books, 2010.
Rating:
Los Angeles : SAGE, [2009]
Rating:
New York : Routledge, 2010.
Rating:
Cambridge ; New York : Cambridge University Press, 2003.
Rating:
Berk, Zeki.
Burlington : Elsevier Science, 2013.
Rating:
Morley, David, 1949-
London ; New York : Routledge, 2007.
Rating:
Harris, Jan Ll., 1969-
London ; New York : Routledge, 2005.
Rating:
London ; Thousand Oaks [Calif.] : SAGE, 2002.
Rating:
Williams, Frederick, 1933-
New York : Free Press ; London : Collier Macmillan, [1988]
Rating:
Cresskill, N.J. : Hampton Press, [2004]
Rating:
New York : Nova Science Publishers, [2021]
Rating:
Howard, Philip N.
Cambridge ; New York : Cambridge University Press, 2006.
Rating:
Haan, Jos de, 1960-
[Den Haag] : Dr. P.A. Tiele-Stichting ; Amsterdam : Amsterdam University Press, [2010]
Rating:
Howard, Philip N.
Cambridge ; New York : Cambridge University Press, 2006.
Rating:
Kreiss, Daniel.
New York : Oxford University Press, [2012]
Rating:
Gainesville : University of Florida Press, [2021]
Rating:
Pschera, Alexander, author.
New York : New Vessel Press, [2016]
Rating:
Bingley, UK : Emerald, 2011.
1st ed.
Rating:
Berkeley : University of California Press, [2014]
Rating:
Duarte, German A., 1983- author.
Bielefeld : Transcript Verlag, [2014]
Rating:
Parks, Lisa, author.
New York : Routledge, Taylor and Francis Group, 2018.
Rating:
New York, NY : Oxford University Press, [2013]
Rating:
Ehrat, Johannes, 1952-
Toronto ; Buffalo [N.Y.] : University of Toronto Press, [2011]
Rating:
Walnut Creek, Calif. : Left Coast Press, 2010.
Rating:
Carey, James W.
New York : Routledge, 2009.
Rev. ed.
Rating:
Cambridge ; New York : Cambridge University Press, 2003.
Rating:
Chester, Jeff.
New York : New Press : Distributed by W.W. Norton, 2007.
Rating:
Gane, Nicholas, 1971-
Oxford ; New York : Berg, 2008.
English ed.
Rating:
New York, New York ; Oxford, England : Berghahn Books, 2014.
Rating:
London : Bloomsbury Academic, 2016.
Rating:
New York : New York University Press, [2016]
Rating:
Athens : Ohio University Press, 2017.
Rating:
Lachapelle, Guy, 1955-
Berlin/Boston, Germany : De Gruyter, 2015.
Rating:
Knoxville : University of Tennessee Press, 2004.
1st ed.
Rating:
New York : Routledge, 2010.
Rating:
Fleming, Dan, author.
New York, New York ; London [England] : Continuum, 2011.
Rating:
Beer, David, 1977- author.
Bingley, UK : Emerald Publishing Limited, 2019.
Rating:
Davidson, Cathy N., 1949-
Cambridge, Mass. : MIT Press, [2010]
Rating:
Tinnell, John, author.
New York, NY : Oxford University Press, 2018.
Rating:
Karbaum Padilla, Gerardo, author.
Lima, Perú : Editorial UPC, 2021.
Rating:
Hershey, PA : Information Science Reference, 2012.
Rating:
International Conference on Mechanical and Aerospace Engineering (2nd : 2011 : Bangkok, Thailand)
Durnten-Zurich : Trans Tech Publications, 2012.
Rating:
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