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| entries 78-388 |
Materials Park, Ohio : ASM International, 2005.
Rating:
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Shawbury, Shrewsbury, Shropshire, U.K. : Rapra Technology, 2005.
Rating:
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Vasile, Cornelia, 1942-
Shrewsbury : RAPRA Technology, 2005.
Rating:
|
Cambridge, UK : Royal Society of Chemistry, [2005]
Rating:
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Laurent, Claire.
Les Ulis : EDP Science ; Angers : ADEME Editions, 2005.
Rating:
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Herzog, Thomas, 1941-
München : DETAIL - Institut für internationale Architektur-Dokumentation GmbH & Co. KG, 2004.
Rating:
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Kurtz, Steven M., 1968-
Amsterdam ; Boston : Academic Press, [2004]
Rating:
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Shawbury, Shrewsbury, Shropshire, U.K. : Rapra Technology Ltd., 2004.
Rating:
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Polaski, G.
Shawbury, U.K. : Rapra Technology Ltd., 2004.
Rating:
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Knight, Derek J.
Shawbury, Shrewsbury, Shropshire, U.K. : Rapra Technology Ltd., 2004.
Rating:
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Shawbury : Rapra Technology, [2004]
Rating:
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Pardos, Françoise.
Shawbury : Rapra Technology Ltd., 2004.
Rating:
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Eaves, David.
Shrewsbury, U.K. : Rapra Technology Ltd., 2004.
Rating:
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Carraher, Charles E., Jr., 1941-
Hoboken, N.J. : Wiley, [2003]
2nd ed. / Charles E. Carraher, Jr.
Rating:
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Swift, K. G.
Oxford [England] ; Boston : Butterworth-Heinemann, 2003.
2nd ed.
Rating:
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Davies, Geoff.
Amsterdam ; Boston : Elsevier, Butterworth Heinemann, 2003.
Rating:
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Innes, J.
Shawbury, Shrewsbury, Shropshire, UK : Rapra Technolog Ltd., 2003.
Rating:
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Shawbury : Rapra, 2003.
Rating:
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O'Neill, T. J. (Tom J.)
Shawbury, U.K. : Rapra Technology Ltd., 2003.
Rating:
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Crawford, R. J.
Shrewsbury : Rapra Technology, [2003]
Rating:
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Rivers, Shayne.
Oxford, England ; Burlington, MA : Butterworth Heinemann, 2003.
Rating:
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Snyder, Carl H.
Hoboken, NJ : J. Wiley, [2003]
4th ed.
Rating:
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River Edge, NJ : World Scientific Pub., [2002]
Rating:
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Tong, Liyong, 1963-
Boston : Elsevier, 2002.
1st ed.
Rating:
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Chrisochoou, Andreas.
Shawbury, U.K. : Rapra Technology Ltd., 2002.
Rating:
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Goodship, Vannessa.
Shrewsbury, U.K. : Rapra Technology, 2002.
Rating:
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Cross, Graham Harry, 1964-
Shawbury, U.K. : Rapra Technology Ltd., 2002.
Rating:
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Tripathi, Devesh.
Shawbury, U.K. : Rapra Technology Ltd., 2002.
Rating:
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Halliwell, S. M.
Shawbury, U.K. : Rapra Technology Ltd., 2002.
Rating:
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Shrewsbury, U.K. : Rapra Technology, 2002.
Rating:
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Bledzki, A. K.
Shawbury, Shrewsbury, Shropshire, U.K. : Rapra Technology Ltd., 2002.
Rating:
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Forsdyke, Ken L.
Shawbury, Shrewsbury, Shropshire, UK : Rapra Technology, 2002.
Rating:
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Litvinov, Victor M.
Shawbury, Shrewsbury, Shropshire : Rapra Technology Ltd., 2002.
Rating:
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Danson, Barney.
Toronto, Ont. : Dundurn Group, [2002]
Rating:
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Packham, D. E. (David Ernest), 1939-
Shawbury, U.K. : Rapra Technology Ltd., 2002.
Rating:
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Brewis, D. M.
Shawbury, Shrewsbury, Shropshire, U.K. : Rapra Technology Ltd., 2002.
Rating:
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Hoffmann, Peter, 1935-
Cambridge, Mass. : MIT Press, [2001]
Rating:
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Alcock, C. B.
Oxford ; Boston : Butterworth-Heinemann, 2001.
Rating:
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Chattopadhyay, R.
Materials Park, Ohio : ASM International, [2001]
Rating:
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Christie, R. M.
Cambridge : Royal Society of Chemistry, [2001]
Rating:
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Stafford, Trevor.
Shawbury, Shrewsbury, Shropshire, UK : Rapra Technology Ltd., [2001]
Rating:
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New York : Marcel Dekker, 2000.
2nd ed., rev. and expanded / edited by Cornelia Vasile.
Rating:
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New York : Marcel Dekker, [1999]
Rating:
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Smallman, R. E.
Oxford ; Boston : Butterworth Heinemann, 1999.
6th ed. / R.E. Smallman, R.J. Bishop.
Rating:
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Aguado Alonso, José.
Cambridge : Royal Society of Chemistry, [1999]
Rating:
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Washington, DC : U.S. Dept. of Labor, Occupational Safety & Health Administration, [1998]
Rating:
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Norwich, NY : Plastics Design Library, [1998]
Rating:
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Maier, Clive.
Norwich, NY : Plastics Design Library, [1998]
Rating:
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Charles, J. A.
Oxford ; Boston : Butterworth Heinemann, 1997.
3rd ed.
Rating:
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Oxford ; Boston : Butterworth-Heinemann, 1997.
2nd ed.
Rating:
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