| Description |
1 online resource (xiv, 213 pages) : illustrations |
| Physical Medium |
polychrome |
| Description |
text file |
| Bibliography |
Includes bibliographical references and index. |
| Contents |
Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index. |
| Summary |
This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. |
| Access |
Use copy Restrictions unspecified MiAaHDL |
| Reproduction |
Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL |
| System Details |
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL |
| Processing Action |
digitized 2010 HathiTrust Digital Library committed to preserve MiAaHDL |
| Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
| Subject |
Integrated circuits -- Testing.
|
|
Integrated circuits -- Testing. |
|
Semiconductors -- Testing.
|
|
Semiconductors -- Testing. |
| Genre/Form |
Electronic books.
|
| Other Form: |
Print version: Afshar, Amir. Principles of semiconductor network testing. Boston : Butterworth-Heinemann, ©1995 0750694726 9780750694728 (DLC) 95013386 (OCoLC)32275164 |
| ISBN |
9780080539560 (electronic book) |
|
0080539564 (electronic book) |
|
9780750694728 |
|
0750694726 (hardcover ; alkaline paper) |
|
