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BestsellerE-book
Author Goodhew, Peter J., author.

Title Electron microscopy and analysis / Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK.

Publication Info. Boca Raton : CRC Press, Taylor & Francis Group, 2017.
©2001

Item Status

Edition Third edition.
Description 1 online resource (x, 251 pages) : illustrations
Physical Medium polychrome
Description text file
Summary Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.
Bibliography Includes bibliographical references and index.
Contents Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Electron microscopy.
Electron microscopy.
Genre/Form Electronic books.
Added Author Humphreys, F. J., author.
Beanland, R., author.
Other Form: Print version: GOODHEW, PETER J. Electron microscopy and analysis, third edition. [Place of publication not identified], CRC Press, 2017 1138441538 (OCoLC)995776598
ISBN 9781420017250 (electronic book)
142001725X (electronic book)
9781138441538 (hardback)
1138441538 (hardback)
9780748409686 (paperback)
0748409688 (paperback)