| Description |
1 online resource (xxvi, 822 pages) : illustrations |
| Physical Medium |
polychrome |
| Description |
text file |
| Bibliography |
Includes bibliographical references and author index. |
| Contents |
Committee Members; Preface; CONTENTS; I. Plenary Lectures; Kinetic Theory of Fluctuations: Forty Years in Progress (Invited); Noise in Nanoscale Devices (Invited); Frontiers of Noise Research (Invited); II. Materials; Mesoscopic Noise Experiments on Colossal Magnetoresistance (Invited); 1/f Noise in Thin Single Domain Ni80Fe20 Films (Invited); Local Magnetic Order in Manganite Thin Films Studied by 1/f Noise Measurements; 1/f Voltage Noise Induced by Magnetic Flux Flow in Granular Superconductors. |
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Nature of Sharp Temperature Dependency of Normal Phase Flicker Noise of Epitaxial YBa2Cu3O7-x FilmsNoise Transport and Structural Properties of High-Tc YBa2Cu3O7-x Films with Noise Hooge-parameter in Normal State Near to 10-6; Dynamics of Individual Traps in Submicron High-temperature Superconductor Grain Boundary Junctions; Large Conductance Noise in Ceramic High Tc Superconductors Submitted to a Low Frequency A.C. Magnetic Field; Voltage Fluctuations Associated with Unbinding of Vortex Pairs in the Presence of Current. |
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Current-induced Voltage Noise and Vortex Dynamics in Thick a-MoxSi1-x FilmsLow-Frequency Noise in Gallium Nitride Thin Films Deposited by rf-plasma Assisted MBE on Intermediate-Temperature Buffer Layers (Invited); Generation-recombination Noise in Si-doped AIN; Non-equilibrium Flicker Noise in Conducting Films and Thin Film Resistors; Dependence of Current 1/f Noise of VOx Films on Their Phase Composition and Structure; Low Frequency Noise and Non-Linear Transport in Charge-ordered Manganites; 1/f Noise in Undoped Hydrogenated Amorphous Silicon and Silicon-germanium Alloys (Invited). |
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Low Frequency Noise of Thin Ta205 Amorphous FilmsLow Frequency Noise Analysis of Different Types of Polysilicon Resistors; 1/f Resistance Fluctuation of the Carbon Fiber; Spin-Dependent Noise; Universal Conductance Fluctuations and Scale Invariance Near the Metal-insulator Transition; Temperature and Doping Dependence of Conductivity Noise in Degenerately Doped Si Single Crystals; Experimental Study of 1/f Fluctuations at Nonequilibrium Phase Transitions; Evaluation of Ni/n-SiC Ohmic Contacts by Current Noise Measurements; III. Devices; III. 1 MOS Transistors. |
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Lorentzian Components in Low-frequency Noise Spectra of SOI MOSFETs (Invited)On the 1/f Noise in Fully Depleted SOI Transistors; Low Frequency Noise Characterization in 0.18 um Technology n and p Channel MOSFETs; Effect of Forward and Reverse Substrate Biasing on Low Frequency Noise in Silicon P-MOSFETs; Low Frequency Noise in CMOS Transistors: An Experimental and Comparative Study on Different Technologies; Impact of Gate Engineering and Silicidation on Low Frequency Noise Characteristics in 0.18 um Technology MOSFETs. |
| Summary |
The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide. Contents: Noise in Nanoscale Devices (S Bandyopadhyay et al.); 1/f Voltage Noise Induced by Magnetic Flux Flow in Granular Superconductors (O V. |
| Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
| Subject |
Electronic noise -- Congresses.
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Electronic noise. |
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Fluctuations (Physics) -- Congresses.
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Fluctuations (Physics) |
| Genre/Form |
Electronic books.
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Conference papers and proceedings.
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Conference papers and proceedings.
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| Added Author |
Bosman, Gijs.
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| Other Form: |
Print version: International Conference on Noise in Physical Systems and 1/f Fluctuations (1st6th : 2001 : Gainesville, Fla.). Noise in physical systems and 1/f fluctuations. River Edge, N.J. : World Scientific, ©2001 9810246773 9789810246778 (DLC) 2002281781 (OCoLC)50441357 |
| ISBN |
9789812811165 (electronic book) |
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9812811168 (electronic book) |
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