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Credo Reference (Firm),
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Chichester, UK ; Hoboken, New Jersey : John Wiley & Sons, 2016.
[Enhanced Credo edition]
Rating:
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London [Eng.] : Routledge ; Westport, Conn. : Greenwood Press, 1997.
Rating:
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Amsterdam [Netherlands] : Elsevier Academic Press, [2004]
Rating:
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New York [N.Y.] : Routledge, 2001.
2nd ed.
Rating:
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Rice, Stanley A., 1957- author.
New York [New York] : Facts On File, 2015.
Revised edition.
Rating:
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Singapore : Springer, 2017.
[Enhanced Credo edition]
Rating:
|
New York, NY : Facts On File, 2012.
[Enhanced Credo edition]
Rating:
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Chicago [Ill.] : Fitzroy Dearborn Publishers, 2000.
Rating:
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Sullivan, Steve, 1954- author.
Lanham [Maryland] : Scarecrow Press, Inc., 2013.
[Enhanced Credo edition]
Rating:
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Ravindran, P. N., 1942- author.
Boston, Massachusetts : CAB International Publishing, 2017.
[Enhanced Credo edition]
Rating:
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New York, NY : Facts On File, 2016.
Second edition.
Rating:
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Amenia, N.Y. : Grey House Publishing, [2016]
Third edition.
Rating:
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London, England : Elsevier/Academic Press, 2009.
2nd ed.
Rating:
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Armonk, N.Y. : Sharpe Reference, [2005]
Rating:
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Bell, Daniel, 1965- author.
Boston, Massachusetts : Credo Reference, 2013.
[New ed.].
Rating:
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San Diego, Calif. : Academic Press, 2003.
Rating:
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Amenia, N.Y. : Grey House Publishing, [2016]
Third edition.
Rating:
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Campo, Juan Eduardo, 1950- author.
New York, NY : Facts On File, 2016.
Second edition.
Rating:
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Farmington Hills, Michigan : Macmillan Reference USA, a part of Gale, Cengage Learning, 2016.
Second edition.
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Armonk, N.Y. : M.E. Sharpe, [2012]
Rating:
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Karesh, Sara E., author.
New York, NY : Facts On File, 2016.
Second edition.
Rating:
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Boston, Massachusetts : Credo Reference, 2013.
Second edition ; [enhanced Credo edition].
Rating:
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London [Eng.] : Routledge, 2004.
Rating:
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London [Eng.] : Fitzroy Dearborn, 2001.
Rating:
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Malden, Mass. : Wiley-Blackwell, 2011.
Rating:
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Cheltenham [Eng.] ; Northampton, Mass. : E. Elgar, [2002]
Rating:
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Nichols, C. Reid, author.
New York, NY : Facts On File, 2017.
Revised edition.
Rating:
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New York [N.Y.] : Kluwer Academic/Plenum Publishers, [2004]
Rating:
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Ruud, Jay, author.
New York [New York] : Facts On File, [2014]
Second edition.
Rating:
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Rothfeld, Glenn S., author.
New York, New York : Facts on File, 2017.
Second edition.
Rating:
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Chicago [Ill.] : Fitzroy Dearborn Publishers, 1997.
Rating:
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Amsterdam [Netherlands] : Elsevier, imprint Academic Press, 2019.
Fourth edition.
Rating:
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New York, NY : Facts On File, 2017.
[Enhanced Credo edition]
Rating:
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Bane, Theresa, 1969- author.
Jefferson, North Carolina : McFarland and Company, Inc., 2020.
[Enhanced Credo edition]
Rating:
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San Diego, Calif. ; London [Eng.] : Academic Press, [2001]
Rating:
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San Diego, Calif. ; London [Eng.] : Academic Press, [2001]
Rating:
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New York [N.Y.] : Springer Pub., [2012]
Rating:
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New Brunswick, N.J. : Rutgers University Press, [2004]
Rating:
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Bangalore, India : Panther Publishers, 2018.
Second edition.
Rating:
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Powell, John, 1954- author.
New York, NY : Facts on File, 2016.
Second edition.
Rating:
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Boston [Mass.] : Houghton Mifflin Company, [1996]
Rating:
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New York, NY : Springer Publishing Company, [2017]
Fourth edition.
Rating:
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Ronzio, Robert A., author.
New York, NY : Facts On File, 2017.
Third edition.
Rating:
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Cassell, Dana K., author.
New York, New York : Facts on File, 2018.
Fourth edition.
Rating:
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Amsterdam [Netherlands] : Academic Press, 2019.
Third edition.
Rating:
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Chicago [Ill.] : Fitzroy Dearborn Publishers, 1999.
Rating:
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Verkamp, Bernard J. (Bernard Joseph), 1938-
Jefferson, N.C. : McFarland & Co., Inc., Publishers, [2008]
Rating:
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London [Eng.] : Routledge, 2005.
2nd ed.
Rating:
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London [Eng.] : Routledge, 2001.
Rating:
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New York, New York : Facts On File, [2017]
[Enhanced Credo edition]
Rating:
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