LEADER 00000cam a2200637Ka 4500 001 ocn842264698 003 OCoLC 005 20160527041348.3 006 m o d 007 cr cnu---unuuu 008 130509s1999 si a ob 001 0 eng d 019 853361940 020 9789812817228|q(electronic book) 020 9812817220|q(electronic book) 020 |z9810228716 020 |z9789810228712 035 (OCoLC)842264698|z(OCoLC)853361940 040 N$T|beng|epn|cN$T|dE7B|dIDEBK|dOCLCF|dYDXCP|dEBLCP|dOCLCQ 049 RIDW 050 4 QD945|b.M247 1999eb 072 7 SCI|x016000|2bisacsh 082 04 548/.83|222 084 PHY 606f|2stub 084 UQ 5600|2rvk 090 QD945|b.M247 1999eb 100 1 Marín, C.|q(Carlos),|d1970-|0https://id.loc.gov/ authorities/names/n98109591 245 10 Orientation of single crystals by back-reflection Laue pattern simulation /|cC. Marín & E. Diéguez. 264 1 Singapore ;|aRiver Edge, N.J. :|bWorld Scientific,|c[1999] 264 4 |c©1999 300 1 online resource (xiii, 164 pages) :|billustrations 336 text|btxt|2rdacontent 337 computer|bc|2rdamedia 338 online resource|bcr|2rdacarrier 340 |gpolychrome|2rdacc 347 text file|2rdaft 500 Some online versions lack accompanying media packaged with the printed version. 504 Includes bibliographical references (pages 159-161) and index. 505 0 NOTE FROM AUTHORS; PREFACE; CONTENTS; CHAPTER 1 X-RAY DIFFRACTION BY CRYSTAL LATTICES; 1.1 Production of X-rays; 1.2 Detection of X-rays; 1.3 Crystal geometry; 1.3.1 Classification of crystallographic systems; 1.3.2 Miller indices and the reciprocal lattice; 1.4 Scattering by an atom; 1.5 Diffraction by lattices and the Bragg law; CHAPTER 2 BACK-REFLECTION LAUE TECHNIQUE; 2.1 Geometry of the back-reflection Laue technique; 2.2 Applications of the back-reflection Laue technique; 2.3 Factors which determine the diffraction intensities in the back- reflection Laue patterns. 505 8 2.3.1 Incident radiation2.3.2 Film detector; 2.3.3 Structure factor (F); 2.3.4 Temperature factor; 2.3.5 Anomalous dispersion; 2.3.6 Polarization factor; 2.3.7 Absorption factor; 2.3.8 Lorentz factor; CHAPTER 3 DEVELOPMENT OF THE COMPUTATIONAL PROCEDURES FOR THE SIMULATION AND INDEXING OF BACK-REFLECTION LAUE PATTERNS; 3.1 Geometrical simulation procedure; 3.2 Estimation of intensities procedure; 3.2.1 Procedure for the estimation of intensities; 3.2.2 Results and comments about the estimation of intensities. 505 8 3.2.2.a Comparison between the simulation of back- reflection patterns with and without estimation of intensities3.2.2.b Filtering amd characteristic limes effects; 3.2.2.c Exposure time effects; 3.2.2. d Film detector effects; 3.2.2.e Distinction of anisotropic orientations; 3.3 Indexing method; 3.3.1 Indexing procedure; 3.3.2 Indexing result; 3.3.3 Strategy for the indexing work; CHAPTER 4 PROGRAMMING AND USE OF THE SUPPLIED SOFTWARE; 4.1 Code development; 4.2 Hardware specifications and installation procedure; 4.3 User manual; 4.3.1 Input of the geometrical data; 4.3.2 Selection of the job. 505 8 4.3.3 Simulation4.3.4 Indexing; CHAPTER 5 COMPARISON AND DISCUSSION BETWEEN SIMULATED AND EXPERIMENTAL PATTERNS OF SAMPLES OF THE SEVEN CRYSTAL LATTICE; 5.1 Cubic: GaSb; 5.2 Tetragonal: KH2PO4; 5.3 Orthorhombic: KTiOPO4; 5.4 Monoclinic: (CH2NH2COOH)3H2SO4; 5.5 Hexagonal: ZnO; 5.6 Rhombohedral: LiNbO3; 5.7 Triclinic: Na2W4O13; APPENDICES; A1 The 230 Space Groups; A2 Crystal structures data; LIST OF SYMBOLS; REFERENCES; SUBJECT INDEX. 520 Laue-grams are the easiest X-ray diffraction patterns that can be obtained and are very useful for orienting single crystals and finding out the symmetry of a projection. Despite the simplicity of the experimental equipment, the orientation work is a costly and time consuming process. It would be a great advantage to be able to simulate any kind of Laue-gram and to identify an unknown crystal orientation, including anisotropic ones. This book presents the complete numerical algorithms for simulation of X-ray back-reflection Laue-grams by evaluating the main factors that affect the intensities o. 588 0 Print version record. 590 eBooks on EBSCOhost|bEBSCO eBook Subscription Academic Collection - North America 650 0 X-ray crystallography.|0https://id.loc.gov/authorities/ subjects/sh85148730 650 7 X-ray crystallography.|2fast|0https://id.worldcat.org/fast /1181820 655 4 Electronic books. 700 1 Diéguez, E.|q(Ernesto)|0https://id.loc.gov/authorities/ names/n98108201 776 08 |iPrint version:|aMarín, C. (Carlos), 1970-|tOrientation of single crystals by back-reflection Laue pattern simulation.|dSingapore ; River Edge, N.J. : World Scientific, ©1999|z9810228716|w(DLC) 98054444 |w(OCoLC)40545400 856 40 |uhttps://rider.idm.oclc.org/login?url=http:// search.ebscohost.com/login.aspx?direct=true&scope=site& db=nlebk&AN=564355|zOnline eBook. Access restricted to current Rider University students, faculty, and staff. 856 42 |3Instructions for reading/downloading this eBook|uhttp:// guides.rider.edu/ebooks/ebsco 901 MARCIVE 20231220 948 |d20160607|cEBSCO|tebscoebooksacademic|lridw 994 92|bRID