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LEADER 00000cam a2200637Ka 4500 
001    ocn842264698 
003    OCoLC 
005    20160527041348.3 
006    m     o  d         
007    cr cnu---unuuu 
008    130509s1999    si a    ob    001 0 eng d 
019    853361940 
020    9789812817228|q(electronic book) 
020    9812817220|q(electronic book) 
020    |z9810228716 
020    |z9789810228712 
035    (OCoLC)842264698|z(OCoLC)853361940 
040    N$T|beng|epn|cN$T|dE7B|dIDEBK|dOCLCF|dYDXCP|dEBLCP|dOCLCQ 
049    RIDW 
050  4 QD945|b.M247 1999eb 
072  7 SCI|x016000|2bisacsh 
082 04 548/.83|222 
084    PHY 606f|2stub 
084    UQ 5600|2rvk 
090    QD945|b.M247 1999eb 
100 1  Marín, C.|q(Carlos),|d1970-|0https://id.loc.gov/
       authorities/names/n98109591 
245 10 Orientation of single crystals by back-reflection Laue 
       pattern simulation /|cC. Marín & E. Diéguez. 
264  1 Singapore ;|aRiver Edge, N.J. :|bWorld Scientific,|c[1999]
264  4 |c©1999 
300    1 online resource (xiii, 164 pages) :|billustrations 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
340    |gpolychrome|2rdacc 
347    text file|2rdaft 
500    Some online versions lack accompanying media packaged with
       the printed version. 
504    Includes bibliographical references (pages 159-161) and 
       index. 
505 0  NOTE FROM AUTHORS; PREFACE; CONTENTS; CHAPTER 1 X-RAY 
       DIFFRACTION BY CRYSTAL LATTICES; 1.1 Production of X-rays;
       1.2 Detection of X-rays; 1.3 Crystal geometry; 1.3.1 
       Classification of crystallographic systems; 1.3.2 Miller 
       indices and the reciprocal lattice; 1.4 Scattering by an 
       atom; 1.5 Diffraction by lattices and the Bragg law; 
       CHAPTER 2 BACK-REFLECTION LAUE TECHNIQUE; 2.1 Geometry of 
       the back-reflection Laue technique; 2.2 Applications of 
       the back-reflection Laue technique; 2.3 Factors which 
       determine the diffraction intensities in the back-
       reflection Laue patterns. 
505 8  2.3.1 Incident radiation2.3.2 Film detector; 2.3.3 
       Structure factor (F); 2.3.4 Temperature factor; 2.3.5 
       Anomalous dispersion; 2.3.6 Polarization factor; 2.3.7 
       Absorption factor; 2.3.8 Lorentz factor; CHAPTER 3 
       DEVELOPMENT OF THE COMPUTATIONAL PROCEDURES FOR THE 
       SIMULATION AND INDEXING OF BACK-REFLECTION LAUE PATTERNS; 
       3.1 Geometrical simulation procedure; 3.2 Estimation of 
       intensities procedure; 3.2.1 Procedure for the estimation 
       of intensities; 3.2.2 Results and comments about the 
       estimation of intensities. 
505 8  3.2.2.a Comparison between the simulation of back-
       reflection patterns with and without estimation of 
       intensities3.2.2.b Filtering amd characteristic limes 
       effects; 3.2.2.c Exposure time effects; 3.2.2. d Film 
       detector effects; 3.2.2.e Distinction of anisotropic 
       orientations; 3.3 Indexing method; 3.3.1 Indexing 
       procedure; 3.3.2 Indexing result; 3.3.3 Strategy for the 
       indexing work; CHAPTER 4 PROGRAMMING AND USE OF THE 
       SUPPLIED SOFTWARE; 4.1 Code development; 4.2 Hardware 
       specifications and installation procedure; 4.3 User 
       manual; 4.3.1 Input of the geometrical data; 4.3.2 
       Selection of the job. 
505 8  4.3.3 Simulation4.3.4 Indexing; CHAPTER 5 COMPARISON AND 
       DISCUSSION BETWEEN SIMULATED AND EXPERIMENTAL PATTERNS OF 
       SAMPLES OF THE SEVEN CRYSTAL LATTICE; 5.1 Cubic: GaSb; 5.2
       Tetragonal: KH2PO4; 5.3 Orthorhombic: KTiOPO4; 5.4 
       Monoclinic: (CH2NH2COOH)3H2SO4; 5.5 Hexagonal: ZnO; 5.6 
       Rhombohedral: LiNbO3; 5.7 Triclinic: Na2W4O13; APPENDICES;
       A1 The 230 Space Groups; A2 Crystal structures data; LIST 
       OF SYMBOLS; REFERENCES; SUBJECT INDEX. 
520    Laue-grams are the easiest X-ray diffraction patterns that
       can be obtained and are very useful for orienting single 
       crystals and finding out the symmetry of a projection. 
       Despite the simplicity of the experimental equipment, the 
       orientation work is a costly and time consuming process. 
       It would be a great advantage to be able to simulate any 
       kind of Laue-gram and to identify an unknown crystal 
       orientation, including anisotropic ones. This book 
       presents the complete numerical algorithms for simulation 
       of X-ray back-reflection Laue-grams by evaluating the main
       factors that affect the intensities o. 
588 0  Print version record. 
590    eBooks on EBSCOhost|bEBSCO eBook Subscription Academic 
       Collection - North America 
650  0 X-ray crystallography.|0https://id.loc.gov/authorities/
       subjects/sh85148730 
650  7 X-ray crystallography.|2fast|0https://id.worldcat.org/fast
       /1181820 
655  4 Electronic books. 
700 1  Diéguez, E.|q(Ernesto)|0https://id.loc.gov/authorities/
       names/n98108201 
776 08 |iPrint version:|aMarín, C. (Carlos), 1970-|tOrientation 
       of single crystals by back-reflection Laue pattern 
       simulation.|dSingapore ; River Edge, N.J. : World 
       Scientific, ©1999|z9810228716|w(DLC)   98054444
       |w(OCoLC)40545400 
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
       search.ebscohost.com/login.aspx?direct=true&scope=site&
       db=nlebk&AN=564355|zOnline eBook. Access restricted to 
       current Rider University students, faculty, and staff. 
856 42 |3Instructions for reading/downloading this eBook|uhttp://
       guides.rider.edu/ebooks/ebsco 
901    MARCIVE 20231220 
948    |d20160607|cEBSCO|tebscoebooksacademic|lridw 
994    92|bRID