| Description |
1 online resource (2 volumes) : illustrations (some color). |
| Physical Medium |
polychrome |
| Description |
text file |
| Series |
World Scientific series in materials and energy ; v. 1-2
|
|
World Scientific series in materials and energy ; v. 1-2.
|
| Bibliography |
Includes bibliographical references and index. |
| Contents |
1. Characterization of semiconductor nanostructures by scanning electron microscopy / Lynne M. Gignac and Oliver C. Wells -- 2. Transmission electron microscopy and ultra-high vacuum transmission electron microscopy of semiconductor nanostructures / Suneel Kodambaka and Frances M. Ross -- 3. Aberration corrected electron microscopy / Philip E. Batson -- 4. Low-energy electron microscopy for nanoscale characterization / James B. Hannon and Rudolf M. Tromp -- 5. Ultrafast microscopy of plasmon dynamics in nanostructured metal surfaces / Hrvoje Petek and Atsushi Kubo -- 6. X-ray diffraction methods for studying strain and composition in epitaxial nanostructured systems / Angelo Malachias [and others] -- 7. Stress determination in semiconductor nanostructures using x-ray diffraction / Conal E. Murray and I. Cevdet Noyan. |
| Summary |
As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures. |
| Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
| Subject |
Nanostructured materials.
|
|
Nanostructured materials. |
|
Nanotechnology.
|
|
Nanotechnology. |
| Genre/Form |
Electronic books.
|
| Added Author |
Haight, Richard.
|
|
Ross, Frances M., 1964-
|
|
Hannon, James B.
|
| Other Form: |
Print version: Handbook of instrumentation and techniques for semiconductor nanostructure characterization. Singapore ; Hackensack, NJ : World Scientific, ©2012 9789814322843 (OCoLC)793201975 |
| ISBN |
9789814322843 (electronic book) |
|
9814322849 (electronic book) |
|
9781299672215 (MyiLibrary) |
|
1299672213 (MyiLibrary) |
|
9789814322805 (set) |
|
9814322806 (set) |
|
9789814322812 (v. 1) |
|
9814322814 (v. 1) |
|
9789814322829 (v. 2) |
|
9814322822 (v. 2) |
|
