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Authors (1-3 of 3)
Humphreys, F. J.,
1
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Electron microscopy and analysis
Goodhew, Peter J., author.
Boca Raton : CRC Press, Taylor & Francis Group, 2017.
Third edition.
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2
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Recrystallization and related annealing phenomena
Humphreys, F. J.
Amsterdam ; Boston : Elsevier, 2004.
2nd ed.
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3
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Recrystallization and related annealing phenomena.
Rollett, A. D. (Anthony D.), author.
Amsterdam : Elsevier, 2017.
Third edition / John Humphreys, Gregory S. Rohrer, Anthony Rollett.
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