Title Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer.

Publication Info.	New York : North-Holland, [1986]
	©1986

Item Status

Location	Call No.	Status	OPAC Message	Public Note	Gift Note
Moore Stacks	QD506 .F39 1986	Available	---

Description	xviii, 352 pages : illustrations ; 24 cm
Bibliography	Includes bibliographies and index.
Subject	Surfaces (Technology) -- Analysis.
	Surfaces (Technology) -- Analysis.
	Thin films -- Analysis.
	Thin films -- Analysis.
	Thin films.
Added Author	Mayer, James W., 1930-
ISBN	0444009892