Birefringent thin films and polarizing elements / Martin W. McCall, Imperial College London, UK, Ian J. Hodgkinson, University of Otago, New Zealand, Qihong Wu, Finisar Australia, Australia.
Hodgkinson's name appears first on the previous edition.
Bibliography
Includes bibliographical references and index.
Contents
""Contents""; ""Preface to the Second Edition""; ""List of Figures""; ""List of Tables""; ""Glossary""; ""1. Introduction""; ""1.1 Structural Classification of Crystals""; ""1.2 Optical Classification of Crystals""; ""1.3 Structure of Birefringent Films""; ""1.4 Optical Classification of Birefringent Films""; ""1.5 Layout of the Book""; ""Part 1. Propagation in Biaxial Media""; ""2. Propagation Equations""; ""2.1 Maxwell�s Equations""; ""2.2 Propagation in Free Space. Mathematical Methods""; ""2.2.1 SI units""; ""2.3 Propagation in Isotropic Media""; ""2.4 Propagation in Anisotropic Media""
""2.5 Energy Flow""""2.6 Notation for Biaxial Media""; ""2.6.1 Material axes""; ""2.6.2 Propagation axes""; ""2.6.3 Rotations""; ""2.6.4 Computations""; ""2.7 Propagation in a Common Direction in a Biaxial Medium""; ""2.7.1 Maxwell�s equations""; ""2.7.2 Fresnel�s equation""; ""2.7.3 Eigenequations for normalized fields""; ""3. Basis Vectors""; ""3.1 Partially Coherent States""; ""3.1.1 Coherence""; ""3.1.2 Stokes parameters""; ""3.1.3 Stokes vectors""; ""3.1.4 Degree of polarization""; ""3.1.5 Unpolarized light""; ""3.1.6 Partially polarized light""; ""3.1.7 Polarized light""
""3.1.8 Basis vectors""""3.2 Coherent States""; ""3.2.1 Jones vectors""; ""3.2.2 Elliptical polarization""; ""3.2.3 Circular polarization""; ""3.2.4 Linear polarization""; ""3.2.5 Basis vectors""; ""3.2.6 Photons""; ""3.2.7 Ellipsometric parameters""; ""3.3 Propagation in Layered Biaxial Media""; ""3.3.1 Fresnel�s quartic equation""; ""3.3.2 Propagation in the deposition plane""; ""3.3.3 Uniaxial media""; ""3.3.4 Isotropic media""; ""3.3.5 Basis travelling wave fields""; ""3.3.6 Power""; ""3.3.7 Change of basis""; ""4. Transfer Matrices""; ""4.1 Mueller Calculus""
""4.1.1 Rotated elements""""4.1.2 Elements in series""; ""4.1.3 Characterization of reflecting surfaces""; ""4.1.4 Mueller calculus computations""; ""4.2 Jones Calculus""; ""4.2.1 Linear polarizer""; ""4.2.2 Retardation plate""; ""4.2.3 Quarter-wave plate""; ""4.2.4 Rotated elements""; ""4.2.5 Elements in series""; ""4.2.6 Periodic arrangements""; ""4.2.7 Jones calculus computations""; ""4.3 Relationship of Mueller Calculus and Jones Calculus""; ""4.4 Berreman Calculus""; ""4.4.1 Field matrix Ë? F""; ""4.4.2 Field coefficients a""; ""4.4.3 Total field m""; ""4.4.4 Phase matrix AË?d""
""4.4.5 Characteristic matrix Ë?M""""4.4.6 System matrix A""; ""4.4.7 Properties of Ë?M""; ""4.4.8 Computation of film parameters from Ë?M""; ""4.5 Abeles and Heavens Calculus""; ""4.5.1 Isotropic layer""; ""4.5.2 Deposition plane""; ""4.6 Film and Toolbox Structures""; ""4.6.1 PS coatings""; ""4.6.2 Interfaces""; ""4.6.3 Application of the BTF Toolbox""; ""4.6.4 Chiral coatings""; ""4.7 Relationship of Jones and Berreman Calculus""; ""4.7.1 Jonesmatrix with interference""; ""4.7.2 Jones matrix with reflections but without interference""; ""5. Reflection and Transmission""
Local Note
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