| Description |
1 online resource (249 pages) |
| Physical Medium |
polychrome |
| Description |
text file |
| Summary |
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi. |
| Bibliography |
Includes bibliographical references (pages 231-237). |
| Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
| Subject |
Fluorescence spectroscopy.
|
|
Fluorescence spectroscopy. |
|
X-ray spectroscopy.
|
|
X-ray spectroscopy. |
|
X-rays -- Diffraction.
|
|
X-rays -- Diffraction. |
|
Materials -- Analysis.
|
|
x-ray spectroscopy. |
|
Materials -- Analysis. |
|
x-ray diffraction. |
| Genre/Form |
Electronic books.
|
| Added Author |
Baturin, Alexey A.
|
|
Mikhailov, Anton I.
|
| Other Form: |
Print version: Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra. Newcastle-upon-Tyne : Cambridge Scholars Publisher, ©2019 9781527542464 |
| ISBN |
1527543897 (electronic book) |
|
9781527543898 (electronic book) |
|
1527542467 |
|
9781527542464 |
|
