Title Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

Publication Info.	Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, [2012]
	©2012

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Description	1 online resource (xiii, 299 pages) : illustrations.
Physical Medium	polychrome
Description	text file
Series	Materials science forum, 0255-5476 ; v. 725
	Materials science forum ; v. 725.
Bibliography	Includes bibliographical references and author index.
Local Note	eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject	Semiconductors -- Defects -- Congresses.
	Semiconductors -- Defects.
	Image processing -- Congresses.
	Image processing.
Indexed Term	Defects recognition
	Imaging
	Semicoductors
	DRIP
Genre/Form	Electronic books.
	Conference papers and proceedings.
	Conference papers and proceedings.
Added Author	Yamada-Kaneta, Hiroshi.
	Sakai, Akira.
Other Form:	Print version: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan). Defects-recognition imaging and physics in semiconductors XIV. Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, ©2012 (OCoLC)806197764
ISBN	9783038138563 (electronic book)
	3038138568 (electronic book)
	9770255547605