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Conference Eastern Analytical Symposium (1967 : New York, N.Y.)

Title Physical measurement and analysis of thin films / edited by E. M. Murt and W. G. Guldner.

Publication Info. New York : Plenum Press, 1969.

Item Status

Location Call No. Status OPAC Message Public Note Gift Note
 Moore Stacks  QC176 .E2 1967    Available  ---
Description xi, 194 pages : illustrations ; 24 cm.
Series Progress in analytical chemistry ; v. 2
Progress in analytical chemistry ; v. 2.
Bibliography Includes bibliographies.
Subject Thin films.
Thin films.
Added Author Murt, E. M.
Guldner, W. G.