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Conference International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.)

Title ISTFA 2010 : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International.

Publication Info. Materials Park, Ohio : ASM International, 2010.

Item Status

Description 1 online resource (xix, 464 pages) : color illustrations
Physical Medium polychrome
Description text file
Bibliography Includes bibliographical references and index.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Electronics -- Materials -- Testing -- Congresses.
Electronics -- Materials -- Testing.
Electronics -- Materials.
Electronic apparatus and appliances -- Testing -- Congresses.
Electronic apparatus and appliances -- Testing -- Congresses.
Genre/Form Electronic books.
Conference papers and proceedings.
Conference papers and proceedings.
Added Author ASM International.
Electronic Device Failure Analysis Society.
ISBN 9781615037278 (electronic book)
1615037276 (electronic book)
9781680155105 (electronic book)
1680155105 (electronic book)
9780615030418
9781615030415