Biometric identification.
Steiner, Holger.
Göttingen : Cuvillier Verlag, 2017.
Rating:
Singapore ; Hackensack, NJ : World Scientific, [2012]
Rating:
London : The Institution of Engineering and Technology, 2013.
Rating:
Nelson, Lisa S. (Lisa Sue)
Cambridge, Mass. : MIT Press, [2011]
Rating:
Stevenage : IET, 2019.
Rating:
Washington, D.C. : National Academies Press, [2010]
Rating:
Newcastle upon Tyne, England : Cambridge Scholars Publishing, 2015.
Rating:
Vacca, John R.
Amsterdam ; Boston : Butterworth-Heinemann/Elsevier, [2007]
Rating:
Santa Monica, Calif. : RAND, 2003.
Rating:
Oakville, ON : ARCLER Press, 2020.
Rating:
Modi, Shimon K.
Boston : Artech House, [2011]
Rating:
New York : Nova Science Publishers, Inc., [2011]
Rating:
Durham : Duke University Press, 2018.
Rating:
Wilkinson, Caroline, 1965-
Cambridge : Cambridge University Press, 2012.
Rating:
New York : Nova Science Publishers, c2010.
Rating:
Rodgers, Waymond.
New York : Nova Science Publishers, [2010]
Rating:
Stevenage, United Kingdom : Institution of Engineering and Technology, 2019.
Rating:
Kumar, N. B. Mahesh, author.
Hamburg, Germany : Diplomica Verlag GmbH : Anchor Academic Publishing, 2018.
Rating:
New York : Springer, [2004]
Rating:
London : Institution of Engineering and Technology, 2018.
Rating:
Bock, Lisa.
Birmingham : Packt Publishing, Limited, 2020.
Rating:
Stevenage, UNKNOWN : The Institution of Engineering and Technology, 2017.
Rating:
London : Institution of Engineering and Technology, 2017.
Rating:
Gates, Kelly.
New York : New York University Press, [2011]
Rating:
New York : Nova Science Publishers, Inc., [2017]
Rating:
London, United Kingdom : The Institution of Engineering and Technology, 2017.London, United Kingdom : The Institution of Engineering and Technology, 2017.
Rating:
Wilson, Chuck (J. Charles)
Boca Raton, FL : CRC Press/Taylor & Francis, [2010]
Rating:
Stevenage : Institution of Engineering and Technology, 2021.
Rating:
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