|
Electronic books -- Electronic books.
|
Brown, Roger.
Shawbury, Shrewsbury, Shropshire, U.K. : Smithers, 2009.
Rating:
|
Kunjufu, Jawanza.
Chicago, Ill. : African American Images, 2006.
1st ed.
Rating:
|
Weiss, Jason, 1955-
Middletown, Conn. : Wesleyan University Press, c2011.
Rating:
|
Dean, Cornelia.
Cambridge, Mass. : Harvard University Press, 2009.
Rating:
|
Smith, Andrew F., 1946-
Berkeley : University of California Press, ©2012.
Rating:
|
Hackensack, N.J. : World Scientific, ©2009.
Rating:
|
Basel : Birkhäuser, [2014]
Rating:
|
National Research Council (U.S.). Panel on Materials Science and Engineering.
Washington, D.C. : National Academies Press, ©2010.
Rating:
|
Eisenstein, Zillah R.
London ; New York : Zed Books ; New York, NY : Distributed in the USA exclusively by Palgrave Macmillan, ©2009.
Rating:
|
García Martínez, Florentino.
Leiden : Brill, 2013.
Rating:
|
Dimond, Paul R.
Ann Arbor : University of Michigan Press, ©2005.
[Pbk. ed.].
Rating:
|
Ng, G. W. (Gee Wah), 1964-
Hackensack, NJ : World Scientific, ©2009.
Rating:
|
Altug, Sumru.
Singapore ; Hackensack, NJ : World Scientific, ©2010.
Rating:
|
Washington, DC : Georgetown University Press, [2014]
Ninth edition.
Rating:
|
Gitterman, M.
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2010.
Rating:
|
Bruyn, Severyn Ten Haut, 1927-
Ann Arbor : University of Michigan Press, ©2000.
Rating:
|
Stehr, Nico.
Hackensack, NJ : World Scientific, ©2010.
Rating:
|
Chicago : University of Chicago Press, 2009.
Rating:
|
Guerci, J. R.
Boston : Artech House, ©2010.
Rating:
|
Baerns, M. (Manfred), 1934-
London : Imperial College Press, ©2009.
Rating:
|
Pasher, Edna.
Hoboken, N.J. : John Wiley & Sons, ©2011.
Rating:
|
Chung, Moo K.
Singapore ; Hackensack, NJ : World Scientific Pub. Co., ©2013.
Rating:
|
Belot︠s︡erkovskiĭ, O. M. (Oleg Mikhaĭlovich)
New Jersey : World Scientific, ©2009.
Rating:
|
Chaleff, Ira.
San Francisco : Berrett-Koehler : U.S. trade Bookstores and wholesalers, Ingram Publisher Services, ©2009.
3rd ed.
Rating:
|
Mackil, Emily Maureen, 1973-
Berkeley : University of California Press, ©2012.
Rating:
|
Singapore ; Hackensack, NJ : World Scientific, ©2010.
Rating:
|
Barnes, Natasha.
Ann Arbor : University of Michigan Press, ©2006.
Rating:
|
Saris, Frans W.
Amsterdam : Amsterdam University Press, ©2009.
Rating:
|
Knoops, Geert-Jan G. J.
Leiden : Martinus Nijhoff Publishers, ©2008.
2nd ed.
Rating:
|
Merolla, Jennifer Lee, 1975-
Chicago : University of Chicago Press, 2009.
Rating:
|
Wrobel, Leo A. (Leo Anthony)
Boston : Artech House, ©2009.
Rating:
|
Isenberg, Alison.
Chicago : University of Chicago Press, ©2004.
Rating:
|
Amsterdam ; New York : Rodopi, ©2010.
Rating:
|
Hershey, Daniel.
London : Imperial College Press ; Singapore ; Hackensack, NJ : Distributed by World Scientific Pub., ©2010.
Rating:
|
Weller, M. (Marc)
Leiden ; Boston : Martinus Nijhoff, 2008.
Rating:
|
Voldman, Steven H.
Chichester, West Sussex, U.K. : Wiley, 2011.
Rating:
|
Murawski, Roman.
Amsterdam ; New York, NY : Rodopi, 2010.
Rating:
|
Leiden : Brill, 2011.
Rating:
|
Cutler, Brian L.
Oxford ; New York : Oxford University Press, 2010.
Rating:
|
National Research Council (U.S.). Committee on Advanced Spectroscopic Portals.
Washington, D.C. : National Academies Press, ©2009.
Rating:
|
Freedberg, David.
Chicago : University of Chicago Press, 2002.
Rating:
|
Stanford, Calif. : Stanford Law Books, ©2009.
Rating:
|
Hoboken, N.J. : J. Wiley & Sons, ©2011.
2nd ed.
Rating:
|
Kahn, Si.
San Francisco, CA : Berrett-Koehler, 2005.
Rating:
|
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2009.
Rating:
|
Baigorri Jalón, Jesús, author.
Amsterdam ; Philadelphia : John Benjamins Publishing Company, [2014]
Rating:
|
Amsterdam ; New York : Rodopi, 2010.
Rating:
|
London : Imperial College Press ; Singapore : Distributed by World Scientific Pub. Co., ©2009.
Rating:
|
Tueth, Matthew, 1953-
Hackensack, NJ : World Scientific, ©2010.
Rating:
|
Cambridge, Mass. : Harvard University Press, 2009.
Rating:
|
|