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Conference International Symposium for Testing and Failure Analysis (31st : 2005 : San Jose, Calif.)

Title ISTFA 2005 : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International.

Publication Info. Materials Park, OH : ASM International, [2005]
©2005

Item Status

Description 1 online resource (xviii, 524 pages) : illustrations
Physical Medium polychrome
Description text file
Bibliography Includes bibliographical references and index.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Electronics -- Materials -- Testing -- Congresses.
Electronics -- Materials -- Testing.
Electronics -- Materials.
Electronic apparatus and appliances -- Testing -- Congresses.
Electronic apparatus and appliances -- Testing -- Congresses.
Genre/Form Electronic books.
Conference papers and proceedings.
Conference papers and proceedings.
Added Author ASM International.
Electronic Device Failure Analysis Society.
Other Form: Print version: International Symposium for Testing and Failure Analysis (31st : 2005 : San Jose, Calif.). ISTFA 2005. Materials Park, Ohio : ASM International, ©2005 087170823X (OCoLC)62723362
ISBN 9781615030880 (electronic book)
1615030883 (electronic book)
087170823X
9780871708236