Title ISTFA 2008 : conference proceedings of the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.

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Materials Park, Ohio : ASM International, 2008.

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Online eBook. Access restricted to current Rider University students, faculty, and staff.
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Description	1 online resource (xx, 528 pages) : illustrations
Physical Medium	polychrome
Description	text file
Note	Some online versions lack accompanying media packaged with the printed version.
Bibliography	Includes bibliographical references and index.
Contents	""Contents""; ""IPFA 07 Best Paper""; ""Session 1: Emerging Concepts""; ""Session 2: Packaging and Assembly Level FA I""; ""Session 3: Failure Analysis Process I""; ""Session 4: Package and Assembly Level FA II""; ""Session 5: Circuit-Edit""; ""Session 6: Sample Preparation I""; ""Session 7: Photon Based Techniques I""; ""Session 8: Scanned Probe Microscopy""; ""Session 9: Photon Based Techniques II""; ""Session 10: Posters""; ""Session 11: System Level Failure Analysis""; ""Session 12: Sample Preparation II""; ""Session 13: Test""; ""Session 14: Photon Based Techniques III""
	""Session 15: Nanoprobing""""Session 16: Yield Enhancement""; ""Session 17: Failure Analysis Process II""; ""Session 18: Metrology""; ""Author Index""
Local Note	eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject	Electronics -- Materials -- Testing -- Congresses.
	Electronics -- Materials -- Testing.
	Electronics -- Materials.
	Electronic apparatus and appliances -- Testing -- Congresses.
	Electronic apparatus and appliances -- Testing -- Congresses.
Genre/Form	Electronic books.
	Conference papers and proceedings.
	Conference papers and proceedings.
Added Author	ASM International.
	Electronic Device Failure Analysis Society.
Added Title	International Symposium for Testing and Failure Analysis 2008
	Proceedings of the 34th International Symposium for Testing and Failure Analysis
	34th International Symposium for Testing and Failure Analysis
	Thirty-fourth International Symposium for Testing and Failure Analysis
Other Form:	Print version: International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Oregon.). ISTFA 2008. Materials Park, Ohio : ASM International, 2008 9781615030910 (OCoLC)317955622
ISBN	9781615030910 (electronic book)
	1615030913 (electronic book)
	9780871707147
	0871707144

Title ISTFA 2008 : conference proceedings of the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.

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