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Title Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross ; EDFAS, ASM International.

Imprint Materials Park, Ohio : ASM International, ©2011.

Item Status

Edition 6th ed.
Description 1 online resource (xi, 660 pages) : illustrations
Note "ASM International, 2011, no. 09110Z"--Page 4 of cover.
Some online versions lack accompanying media packaged with the printed version.
Bibliography Includes bibliographical references and indexes.
Contents Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc.
Microelectronics -- Defects -- Testing -- Handbooks, manuals, etc.
Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc.
Electronics -- Materials -- Testing -- Handbooks, manuals, etc.
Electronics -- Materials -- Defects -- Handbooks, manuals, etc.
Genre/Form Electronic books.
Electronic books.
Added Author Ross, Richard J.
ASM International.
Electronic Device Failure Analysis Society.
Added Title Microelectronics failure analysis desk reference
Other Form: Print version: Microelectronics failure analysis. 6th ed. Materials Park, Ohio : ASM International, ©2011 161503725X (OCoLC)701026679
ISBN 9781613447598 (electronic bk.)
1613447590 (electronic bk.)
9781615037261 (electronic bk.)
1615037268 (electronic bk.)
9781615037261 (e-book)