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Title Microelectronics failure analysis [electronic resource] : desk reference / edited by the Electronic Device Failure Analysis Society, Desk Reference Committee.

Imprint Materials Park, Ohio : ASM International, ©2004.

Item Status

Description 1 online resource (xiv, 800 pages) : illustrations
Bibliography Includes bibliographical references and indexes.
Contents Introduction -- Failure analysis process flow -- Failure verification -- Failure mode: failure classifications -- Special devices -- Non-destructive analysis techniques -- Depackaging -- Photon emission (electroluminescence) localization techniques -- Microthermography -- Laser and particle beam-based localization techniques -- Deprocessing -- General imaging techniques -- Local deprocessing and imaging -- Materials analysis techniques -- Important topics for semiconductor devices -- FA techniques/tools roadmaps -- FA operation and management -- Appendix.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc.
Microelectronics -- Defects -- Testing -- Handbooks, manuals, etc.
Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc.
Electronics -- Materials -- Testing -- Handbooks, manuals, etc.
Electronics -- Materials -- Defects -- Handbooks, manuals, etc.
Genre/Form Electronic books.
Added Author Electronic Device Failure Analysis Society. Desk Reference Committee.
ASM International.
Other Form: Print version: Microelectronics failure analysis. Materials Park, Ohio : ASM International, ©2004 (OCoLC)57017140
ISBN 9781615032662 (electronic bk.)
1615032665 (electronic bk.)