LEADER 00000cam a2200757Ia 4500 
001    ocn609419839 
003    OCoLC 
005    20160527040347.6 
006    m     o  d         
007    cr cnu---unuuu 
008    100426s2002    ohua    obf   001 0 eng d 
019    606899822|a764526644|a773176612 
020    9781615032648|q(electronic book) 
020    1615032649|q(electronic book) 
020    |z0871707691 
020    |z9780871707697 
035    (OCoLC)609419839|z(OCoLC)606899822|z(OCoLC)764526644
       |z(OCoLC)773176612 
040    OCLCE|beng|epn|cOCLCE|dOCLCQ|dE7B|dOCLCQ|dN$T|dB24X7
       |dOCLCQ|dNLGGC|dDEBSZ|dYDXCP|dD6H|dOCLCF|dOCL|dEBLCP
       |dOCLCQ 
042    dlr 
049    RIDW 
050  4 TK7871|b.M52 2002eb 
072  7 TEC|x008060|2bisacsh 
072  7 TEC|x008070|2bisacsh 
082 04 621.381|223 
090    TK7871|b.M52 2002eb 
245 00 Microelectronic failure analysis :|bdesk reference : 2002 
       supplement /|cprepared under the direction of the 
       Electronic Device Failure Analysis Society Publications 
       Committee. 
264  1 Materials Park, Ohio :|bASM International,|c[2002] 
264  4 |c©2002 
300    1 online resource (vi, 210 pages) :|billustrations 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
340    |gpolychrome|2rdacc 
347    text file|2rdaft 
504    Includes bibliographical references and index. 
506    |3Use copy|fRestrictions unspecified|2star|5MiAaHDL 
533    Electronic reproduction.|b[S.l.] :|cHathiTrust Digital 
       Library,|d2010.|5MiAaHDL 
538    Master and use copy. Digital master created according to 
       Benchmark for Faithful Digital Reproductions of Monographs
       and Serials, Version 1. Digital Library Federation, 
       December 2002.|uhttp://purl.oclc.org/DLF/benchrepro0212
       |5MiAaHDL 
583 1  digitized|c2010|hHathiTrust Digital Library|lcommitted to 
       preserve|2pda|5MiAaHDL 
588 0  Print version record. 
590    eBooks on EBSCOhost|bEBSCO eBook Subscription Academic 
       Collection - North America 
650  0 Electronics|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh85042388|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Microelectronics|0https://id.loc.gov/authorities/subjects/
       sh85084822|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh2002006405|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Microelectronics|0https://id.loc.gov/authorities/subjects/
       sh85084822|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh2002006405|xDefects|0https://id.loc.gov/
       authorities/subjects/sh99005477|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Electronic apparatus and appliances|xTesting|0https://
       id.loc.gov/authorities/subjects/sh85042269|vHandbooks, 
       manuals, etc.|0https://id.loc.gov/authorities/subjects/
       sh99001300 
650  0 Semiconductors|xDefects|0https://id.loc.gov/authorities/
       subjects/sh85119908|vHandbooks, manuals, etc.|0https://
       id.loc.gov/authorities/subjects/sh99001300 
650  7 Electronics|xMaterials|xTesting.|2fast|0https://
       id.worldcat.org/fast/907571 
650  7 Electronics|xMaterials.|2fast|0https://id.worldcat.org/
       fast/907562 
650  7 Microelectronics|xMaterials|xTesting.|2fast|0https://
       id.worldcat.org/fast/1019774 
650  7 Microelectronics.|2fast|0https://id.worldcat.org/fast/
       1019757 
650  7 Microelectronics|xMaterials|xDefects.|2fast|0https://
       id.worldcat.org/fast/1019772 
650  7 Electronic apparatus and appliances|xTesting.|2fast|0https
       ://id.worldcat.org/fast/906837 
650  7 Semiconductors|xDefects.|2fast|0https://id.worldcat.org/
       fast/1112211 
655  0 Electronic books. 
655  4 Electronic books. 
655  7 Handbooks and manuals.|2fast|0https://id.worldcat.org/fast
       /1423877 
655  7 Handbooks and manuals.|2lcgft|0https://id.loc.gov/
       authorities/genreForms/gf2014026109 
710 2  Electronic Device Failure Analysis Society.|0https://
       id.loc.gov/authorities/names/no99092286 
776 08 |iPrint version:|tMicroelectronic failure analysis.
       |dMaterials Park, Ohio : ASM International, ©2002
       |w(OCoLC)51259869 
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
       search.ebscohost.com/login.aspx?direct=true&scope=site&
       db=nlebk&AN=395856|zOnline eBook. Access restricted to 
       current Rider University students, faculty, and staff. 
856 42 |3Instructions for reading/downloading this eBook|uhttp://
       guides.rider.edu/ebooks/ebsco 
901    MARCIVE 20231220 
948    |d20160616|cEBSCO|tebscoebooksacademic|lridw 
994    92|bRID