LEADER 00000cam a2200817Ka 4500 
001    ocn771901447 
003    OCoLC 
005    20160527041204.9 
006    m     o  d         
007    cr cnu---unuuu 
008    120109s2011    ohua    obf   001 0 eng d 
019    787848225 
020    9781613447598|q(electronic book) 
020    1613447590|q(electronic book) 
020    9781615037261|q(electronic book) 
020    1615037268|q(electronic book) 
020    9781615037261|q(e-book) 
020    |z161503725X 
020    |z9781615037254 
035    (OCoLC)771901447|z(OCoLC)787848225 
040    N$T|beng|epn|cN$T|dVLB|dE7B|dN$T|dGZM|dCOO|dZCU|dDEBSZ
       |dB24X7|dOCLCQ|dKNOVL|dYDXCP|dKNOVL|dOCLCQ|dKNOVL|dOCLCQ 
049    RIDW 
050  4 TK7871|b.M52 2011eb 
072  7 TEC|x008060|2bisacsh 
072  7 TEC|x008070|2bisacsh 
082 04 621.381|223 
090    TK7871|b.M52 2011eb 
245 00 Microelectronics failure analysis :|bdesk reference /
       |cedited by Richard J. Ross ; EDFAS, ASM International. 
246 3  Microelectronics failure analysis desk reference 
250    6th ed. 
264  1 Materials Park, Ohio :|bASM International,|c[2011] 
264  4 |c©2011 
300    1 online resource (xi, 660 pages) :|billustrations 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
340    |gpolychrome|2rdacc 
347    text file|2rdaft 
500    "ASM International, 2011, no. 09110Z"--Page 4 of cover. 
500    Some online versions lack accompanying media packaged with
       the printed version. 
504    Includes bibliographical references and indexes. 
505 0  Section 1. Introduction -- section 2. Failure analysis 
       process overviews -- section 3. Failure analysis topics --
       section 4. Fault verification and classification -- 
       section 5. Localization techniques -- section 6. 
       Deprocessing and sample preparation -- section 7. 
       Inspection -- section 8. Materials analysis -- section 9. 
       Focused ion beam applications -- section 10. Management 
       and reference information. 
588 0  Print version record. 
590    eBooks on EBSCOhost|bEBSCO eBook Subscription Academic 
       Collection - North America 
650  0 Microelectronics|0https://id.loc.gov/authorities/subjects/
       sh85084822|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh2002006405|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Microelectronics|0https://id.loc.gov/authorities/subjects/
       sh85084822|xDefects|0https://id.loc.gov/authorities/
       subjects/sh99005477|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Electronic apparatus and appliances|xTesting|0https://
       id.loc.gov/authorities/subjects/sh85042269|vHandbooks, 
       manuals, etc.|0https://id.loc.gov/authorities/subjects/
       sh99001300 
650  0 Electronics|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh85042388|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Electronics|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh85042388|xDefects|0https://id.loc.gov/
       authorities/subjects/sh99005477|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  7 Microelectronics|xMaterials|xTesting.|2fast|0https://
       id.worldcat.org/fast/1019774 
650  7 Microelectronics.|2fast|0https://id.worldcat.org/fast/
       1019757 
650  7 Testing.|2fast|0https://id.worldcat.org/fast/1148240 
650  7 Electronic apparatus and appliances|xTesting.|2fast|0https
       ://id.worldcat.org/fast/906837 
650  7 Electronics|xMaterials|xTesting.|2fast|0https://
       id.worldcat.org/fast/907571 
650  7 Electronics|xMaterials.|2fast|0https://id.worldcat.org/
       fast/907562 
650  7 Electronics|xMaterials|xDefects.|2fast|0https://
       id.worldcat.org/fast/907564 
655  0 Electronic books. 
655  4 Electronic books. 
655  7 Handbooks and manuals.|2fast|0https://id.worldcat.org/fast
       /1423877 
655  7 Handbooks and manuals.|2lcgft|0https://id.loc.gov/
       authorities/genreForms/gf2014026109 
700 1  Ross, Richard J.|0https://id.loc.gov/authorities/names/
       n00003843 
710 2  ASM International.|0https://id.loc.gov/authorities/names/
       n86066562 
710 2  Electronic Device Failure Analysis Society.|0https://
       id.loc.gov/authorities/names/no99092286 
776 08 |iPrint version:|tMicroelectronics failure analysis.|b6th 
       ed.|dMaterials Park, Ohio : ASM International, ©2011
       |z161503725X|w(OCoLC)701026679 
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
       search.ebscohost.com/login.aspx?direct=true&scope=site&
       db=nlebk&AN=395927|zOnline eBook. Access restricted to 
       current Rider University students, faculty, and staff. 
856 42 |3Instructions for reading/downloading this eBook|uhttp://
       guides.rider.edu/ebooks/ebsco 
901    MARCIVE 20231220 
948    |d20160607|cEBSCO|tebscoebooksacademic|lridw 
994    92|bRID