LEADER 00000cam a2200709Ia 4500 
001    ocn297826771 
003    OCoLC 
005    20160527040945.8 
006    m     o  d         
007    cr cnu---unuuu 
008    090109s2004    ohua    obf   001 0 eng d 
019    762079349|a765135785 
020    9781615032662|q(electronic book) 
020    1615032665|q(electronic book) 
020    |z9780871708045 
020    |z0871708043 
035    (OCoLC)297826771|z(OCoLC)762079349|z(OCoLC)765135785 
040    OCLCE|beng|epn|cOCLCE|dOCLCQ|dE7B|dOCLCQ|dCOO|dB24X7|dN$T
       |dOCLCQ|dYDXCP|dEBLCP|dOCLCQ 
049    RIDW 
050  4 TK7871|b.M52 2004 
072  7 TEC|x008010|2bisacsh 
072  7 TEC|x008020|2bisacsh 
082 04 621.381548|222 
090    TK7871|b.M52 2004 
245 00 Microelectronics failure analysis :|bdesk reference /
       |cedited by the Electronic Device Failure Analysis Society,
       Desk Reference Committee. 
264  1 Materials Park, Ohio :|bASM International,|c[2004] 
264  4 |c©2004 
300    1 online resource (xiv, 800 pages) :|billustrations 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
340    |gpolychrome|2rdacc 
347    text file|2rdaft 
504    Includes bibliographical references and indexes. 
505 00 |gIntroduction --|tFailure analysis process flow --
       |tFailure verification --|tFailure mode: failure 
       classifications --|tSpecial devices --|tNon-destructive 
       analysis techniques --|tDepackaging --|tPhoton emission 
       (electroluminescence) localization techniques --
       |tMicrothermography --|tLaser and particle beam-based 
       localization techniques --|tDeprocessing --|tGeneral 
       imaging techniques --|tLocal deprocessing and imaging --
       |tMaterials analysis techniques --|tImportant topics for 
       semiconductor devices --|tFA techniques/tools roadmaps --
       |tFA operation and management --|gAppendix. 
588 0  Print version record. 
590    eBooks on EBSCOhost|bEBSCO eBook Subscription Academic 
       Collection - North America 
650  0 Microelectronics|0https://id.loc.gov/authorities/subjects/
       sh85084822|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh2002006405|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Microelectronics|0https://id.loc.gov/authorities/subjects/
       sh85084822|xDefects|0https://id.loc.gov/authorities/
       subjects/sh99005477|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Electronic apparatus and appliances|xTesting|0https://
       id.loc.gov/authorities/subjects/sh85042269|vHandbooks, 
       manuals, etc.|0https://id.loc.gov/authorities/subjects/
       sh99001300 
650  0 Electronics|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh85042388|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  0 Electronics|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh85042388|xDefects|0https://id.loc.gov/
       authorities/subjects/sh99005477|vHandbooks, manuals, etc.
       |0https://id.loc.gov/authorities/subjects/sh99001300 
650  7 Microelectronics|xMaterials|xTesting.|2fast|0https://
       id.worldcat.org/fast/1019774 
650  7 Microelectronics.|2fast|0https://id.worldcat.org/fast/
       1019757 
650  7 Testing.|2fast|0https://id.worldcat.org/fast/1148240 
650  7 Electronic apparatus and appliances|xTesting.|2fast|0https
       ://id.worldcat.org/fast/906837 
650  7 Electronics|xMaterials|xTesting.|2fast|0https://
       id.worldcat.org/fast/907571 
650  7 Electronics|xMaterials.|2fast|0https://id.worldcat.org/
       fast/907562 
650  7 Electronics|xMaterials|xDefects.|2fast|0https://
       id.worldcat.org/fast/907564 
655  4 Electronic books. 
655  7 Handbooks and manuals.|2fast|0https://id.worldcat.org/fast
       /1423877 
655  7 Handbooks and manuals.|2lcgft|0https://id.loc.gov/
       authorities/genreForms/gf2014026109 
710 2  Electronic Device Failure Analysis Society.|0https://
       id.loc.gov/authorities/names/no99092286|bDesk Reference 
       Committee. 
710 2  ASM International.|0https://id.loc.gov/authorities/names/
       n86066562 
776 08 |iPrint version:|tMicroelectronics failure analysis.
       |dMaterials Park, Ohio : ASM International, ©2004
       |w(OCoLC)57017140 
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
       search.ebscohost.com/login.aspx?direct=true&scope=site&
       db=nlebk&AN=395872|zOnline eBook. Access restricted to 
       current Rider University students, faculty, and staff. 
856 42 |3Instructions for reading/downloading this eBook|uhttp://
       guides.rider.edu/ebooks/ebsco 
901    MARCIVE 20231220 
948    |d201606016|cEBSCO|tebscoebooksacademic|lridw 
994    92|bRID