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245 00 Radiation effects and soft errors in integrated circuits
and electronic devices /|ceditors, R.D. Schrimpf, D.M.
Fleetwood.
264 1 Singapore ;|aNew Jersey :|bWorld Scientific Pub.,|c[2004]
264 4 |c©2004
300 1 online resource (viii, 339 pages) :|billustrations.
336 text|btxt|2rdacontent
337 computer|bc|2rdamedia
338 online resource|bcr|2rdacarrier
340 |gpolychrome|2rdacc
347 text file|2rdaft
490 1 Selected topics in electronics and systems ;|vvol. 34
504 Includes bibliographical references.
505 0 Preface; CONTENTS; Single Event Effects in Avionics and on
the Ground; 1. Introduction; 2. Similarities between SEE
in Avionics and on the Ground; 3. Differences Between SEE
in Avionics and on the Ground; 4. Atmospheric and Ground
Level Environments; 5. SEE Data in devices; 6. Summary;
Soft Errors in Commercial Integrated Circuits; 1.
Introduction; 2. Scaling trends for memory devices; 3.
Seating trend for peripheral logic devices; 4. Conclusion;
Single-Event Effects in lll-V Semiconductor Electronics;
1. Introduction; 2. Single-Event Effects in lll-V
Electronic Devices.
505 8 3. Summary and ConclusionsInvestigation of Single-Event
Transients in Fast Integrated Circuits with a Pulsed
Laser; 1. Basic Mechanisms of a SET; 2. SET Laser Testing;
3. Experimental set-up for SET laser testing; 4. Results;
5. Conclusions; System Level Single Event Upset Mitigation
Strategies; 1. Introduction; 2. Systems Engineering for
Energetic Particle Environment Compatibility; 3. Fault
Tolerant Systems Strategies; Radiation-Tolerant Design for
High Performance Mixed-Signal Circuits; 1. Introduction;
2. Radiation Mechanisms in Mixed-Signal Integrated
Circuits.
505 8 3. Process Component and Layout Choices for Hardened-by-
Design Circuits4. Total Dose Hardening; 5. Single-Event
Effect Hardening; 6. Dose-Rate Effect Hardening; 7.
Conclusion; A Total-Dose Hardening-By-Design Approach for
High-Speed Mixed-Signal CMOS Integrated Circuits; 1.
Introduction; 2. Closed Geometry Transistors; 3. Circuit
Application-Functional Description; 4. Performance of HBD
APHY Circuit; 5. Conclusions; Radiation Issues in the New
Generation of High Energy Physics Experiments; 1.
Introduction; 2. The Radiation Environment; 3. SEU Rate
Estimate in the LHC.
505 8 4. Radiation-Hard ASICs Design5. Conclusions; Space
Radiation Effects in Optocouplers; 1.0 Introduction; 2.0
Optocoupter Types Addressed in This Paper; 3.0 Physical
Mechanisms of Particle-Induced Transient Effects; 4.0
Physical Mechanisms for Permanent Degradation; 5.0
Conclusions; Radiation Effects in Charge-Coupled Device
(CCD) Imagers and CMOS Active Pixel Sensors; 1.
Introduction; 2. Damage due to Total Ionizing Dose (TTD);
3. Displacement Damage; 4. Transient Events; 5. Future
Work; The Effects of Space Radiation Exposure on Power
MOSFETs: A Review; 1. Introduction.
505 8 2. Power MOSFET Technotogies3. Total Dose Ionizing
Radiation Effects on Power MOSFETs; 4. Single Event
Radiation Effects; 5. Conclusions; Introduction to SOI
MOSFETs: Context Radiation Effects and Future Trends; 1.
Introduction; 2. Current Status of SOI Technology; 3.
Operation Mechanisms in SOI MOSFETs; 4. Radiation Effects
on SOI MOSFETs; 5. Future Trends; 6. Conclusions; Total-
Dose and Single-Event Effects in Silicon-Germanium
Heterojunction Bipolar Transistors; 1. Introduction; 2.
The SiGe HBT; 3. Radiation Response of SiGe HBTs; 4. SiGe
HBT Circuit Tolerance.
520 This book provides a detailed treatment of radiation
effects in electronic devices, including effects at the
material, device, and circuit levels. The emphasis is on
transient effects caused by single ionizing particles
(single-event effects and soft errors) and effects
produced by the cumulative energy deposited by the
radiation (total ionizing dose effects). Bipolar (Si and
SiGe), metal-oxide-semiconductor (MOS), and compound
semiconductor technologies are discussed. In addition to
considering the specific issues associated with high-
performance devices and technologies, the book includes
th.
588 0 Print version record.
590 eBooks on EBSCOhost|bEBSCO eBook Subscription Academic
Collection - North America
650 0 Electronic circuits|0https://id.loc.gov/authorities/
subjects/sh85042279|xEffect of radiation on.|0https://
id.loc.gov/authorities/subjects/sh00002522
650 0 Integrated circuits|xEffect of radiation on.|0https://
id.loc.gov/authorities/subjects/sh85067120
650 7 Electronic circuits.|2fast|0https://id.worldcat.org/fast/
906874
650 7 Integrated circuits|xEffect of radiation on.|2fast|0https:
//id.worldcat.org/fast/975559
655 4 Electronic books.
700 1 Schrimpf, Ronald Donald.|0https://id.loc.gov/authorities/
names/n89629527
700 1 Fleetwood, D. M.|q(Dan M.)|0https://id.loc.gov/authorities
/names/nb2004308696
776 08 |iPrint version:|tRadiation effects and soft errors in
integrated circuits and electronic devices.|dSingapore ;
New Jersey : World Scientific Pub., ©2004|w(DLC)
2006273469
830 0 Selected topics in electronics and systems ;|0https://
id.loc.gov/authorities/names/no95054495|vvol. 34.
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
search.ebscohost.com/login.aspx?direct=true&scope=site&
db=nlebk&AN=235566|zOnline eBook. Access restricted to
current Rider University students, faculty, and staff.
856 42 |3Instructions for reading/downloading this eBook|uhttp://
guides.rider.edu/ebooks/ebsco
901 MARCIVE 20231220
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