Title X-ray diffraction : structure, principles, and applications / editor, Kaimin Shih (Department of Civil Engineering, the University of Hong Kong, Hong Kong).

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Description	1 online resource (pages cm).
Physical Medium	polychrome
Description	text file
Series	Materials Science and Technologies
	Materials science and technologies series.
Note	Includes index.
Summary	An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a m.
Local Note	eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject	Materials -- Microscopy.
	Materials -- Microscopy.
	X-rays -- Diffraction.
	X-rays -- Diffraction.
	X-ray crystallography.
	X-ray crystallography.
	Transmission electron microscopy.
	Transmission electron microscopy.
Genre/Form	Electronic books.
	Electronic books.
Added Author	Shih, Kaimin.
Other Form:	Print version: X-ray diffraction. Hauppauge, New York : Nova Science Publishers, Inc., [2013] 9781628085914 (DLC) 2013028248 (OCoLC)852958471
ISBN	9781628085938 (electronic book)
	1628085932 (electronic book)
	9781628085914
	1628085916