Skip to content
You are not logged in |Login  
     
Limit search to available items
Record 4 of 19
Record:   Prev Next
Resources
More Information
Bestseller
BestsellerE-book

Title Advanced mathematical & computational tools in metrology V / editors P. Ciarlini [and others].

Publication Info. Singapore ; River Edge, N.J. : World Scientific, [2001]
©2001

Item Status

Description 1 online resource.
Physical Medium polychrome
Description text file
Series Series on advances in mathematics for applied sciences ; v. 57
Series on advances in mathematics for applied sciences ; v. 57.
Note Collection of the revised contributions at the fifth workshop on the theme of advanced mathematical and computational tools in metrology held in Caparica, Portugal, in May 2000.
Bibliography Includes bibliographical references and index.
Contents Discrete B-Spline Approximation in a Variety of Norms / I.J. Anderson and D.A. Turner -- Local and Global Calibration of Coordinate Measuring Machines / S.D. Antunes, P.M.V.C.D. Antunes and M.A.F. Vicente -- Parameter Intrinsic Identifiability of Error Models: The Case of Geometrical Errors of CMMs / A. Balsamo -- A Methodology for Testing the Numerical Accuracy of Scientific Software Used in Metrology / J. Barrett, M.G. Cox and M.P. Dainton / [and others] -- A Statistical Model for the Analysis of Single-Photon Counts / S. Castelletto, I.P. Degiovanni and M.L. Rastello -- ActiveX-Tools for Data Acquisition with Automatic ASL-F18 and MI-6010 Bridges / B. Cavigioli, P. Marcarino and A. Merlone / [and others].
Summary Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. This book is of interest to people.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Measurement -- Congresses.
Measurement.
Physical measurements -- Congresses.
Physical measurements.
Genre/Form Electronic books.
Conference papers and proceedings.
Electronic books.
Conference papers and proceedings.
Added Author Ciarlini, P.
Added Title Advanced mathematical and computational tools in metrology V
ISBN 9789812811684 (electronic book)
9812811680 (electronic book)
9789810244941
9810244940
9812811680