Microelectronics -- Defects -- United States. / https://id.loc.gov/authorities/subjects/sh85084822 https://id.loc.gov/authorities/subjects/sh99005477 https://id.loc.gov/authorities/names/n78095330-781 : United States.
Microelectronics industry -- Corrupt practices -- China. / https://id.loc.gov/authorities/subjects/sh85084825 https://id.loc.gov/authorities/subjects/sh99005368 https://id.loc.gov/authorities/names/n79091151-781 : United States.
Microelectronics industry -- United States -- History. / https://id.loc.gov/authorities/subjects/sh85084825 https://id.loc.gov/authorities/names/n78095330-781 https://id.loc.gov/authorities/subjects/sh99005024 : Packard, David,
Microelectronics -- Materials -- Effect of radiation on. / https://id.loc.gov/authorities/subjects/sh85084822 https://id.loc.gov/authorities/subjects/sh2002006405 https://id.loc.gov/authorities/subjects/sh00002522 : National Research Council (U.S.).
Here are entered works on non-traditional banking techniques and methodologies used to provide financial services to clients not served by traditional financial institutions.
Here are entered works on the photographing of objects of any size on a scale too small to be viewed with the naked eye. Works on the photographing of minute objects enlarged by means of a microscope are entered under Photomicrography.