|
Nondestructive testing -- Congresses.
|
International Conference on Advanced Nondestructive Testing (2nd : 2007 : Pusan, Korea)
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2008.
Rating:
|
International Conference on Advanced Nondestructive Testing (2nd : 2007 : Pusan, Korea)
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2008.
Rating:
|
Stafa-Zurich, Switzerland : Trans Tech Publications Ltd, ©2011.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (22nd : 2017 : Saclay, France)
Amsterdam, Netherlands : IOS Press, 2018.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (24th : 2019 : Chengdu, China)
Amsterdam ; Clifton, VA : IOS Press, [2020]
Rating:
|
Amsterdam ; Washington, DC : IOS Press ; Tokyo : Ohmsha, ©2002.
Rating:
|
Amsterdam ; Washington, DC : IOS Press, ©2007.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (12th : 2007 : Cardiff University)
Amsterdam ; Oxford : IOS Press, 2008.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (13th : 2008 : Seoul, Korea)
Amsterdam : IOS ; Lancaster : Gazelle Books Services [distributor], 2009.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (20th : 2015 : Sendai-shi, Miyagi-ken, Japan)
Amsterdam, Netherlands : IOS Press : IOS Press, 2016.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (18th : 2015 : Xi'an Jiaotong University, China)
Amsterdam : IOS Press, 2015.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (21st : 2016 : Lisbon, Portugal)
Amsterdam : IOS Press, 2017.
Rating:
|
International Workshop on Electromagnetic Nondestructive Evaluation (23rd : 2018 : Detroit, Mich.)
Amsterdam : IOS Press, 2019.
Rating:
|
International Symposium on Nondestructive Characterization of Materials (11th : 2002 : Berlin, Germany)
Berlin : Springer, 2003.
Rating:
|
Workshop on Materials State Awareness (2007 : Woods Hole, Mass.)
Washington, D.C. : National Academies Press, 2008.
Rating:
|
|