System analysis.
Lee, Sang M., 1939-
Lincoln : University of Nebraska Press, [1983]
Rating:
[Homewood, Ill.] : ETC Publications, 1973.
Rating:
Cambridge : Cambridge University Press, 2017.
Rating:
Durnten-Zurich, Switzerland : Trans Tech Publications Ltd, [2013]
Rating:
Girvan, Lynda, author.
London : BCS Learning & Development Ltd, [2017]
Rating:
Chicago (Ill.). Police Department. Operations Research Task Force.
[Washington] : National Institute of Law Enforcement and Criminal Justice; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.], 1972.
Rating:
Casti, J. L.
New York : Wiley, [1989]
Rating:
Stubberud, Allen R.
Berkeley : University of California Press, 1964.
Rating:
Quade, E. S. (Edward S.)
Chicago : Rand McNally, 1964.
Rating:
Sivazlian, B. D.
Englewood Cliffs, N.J. : Prentice-Hall, [1974, c1975]
Rating:
Summers, Michael Roger, 1947-
Westport, Conn. : Quorum Books, 1998.
Rating:
LaPatra, Jack W., 1927-
[Stroudsburg, Pa.] : Dowden, Hutchinson & Ross, [1973]
Rating:
Boothroyd, Hylton.
London : Taylor & Francis ; New York : Halsted Press, 1978.
Rating:
Enciso, Berta.
México, D.F. : Colegio de México, Biblioteca Daniel Cosío Villegas, 1997.
2. ed., corr.
Rating:
Savageau, Michael A.
Reading, Mass. : Addison-Wesley Pub. Co., Advanced Book Program, [1976]
Rating:
Paul, Debra, author.
Swindon, UK : BCS, The Chartered Institute for IT, [2020]
Fourth edition
Rating:
[Place of publication not identified] : World Scientific Pub Co Inc, 2012.
Rating:
Slaughter, Anne-Marie, 1958- author.
New Haven, CT : Yale University Press, [2017]
Rating:
Farnham, England ; Burlington, VT : Ashgate, [2009]
Rating:
Forrester, Jay W.
Cambridge, Mass. : Wright-Allen Press, [1975]
Rating:
Haines, Stephen G.
Amherst, Mass. : HRD Press, [2000]
Rating:
Cherifi, Hocine.
Newcastle upon Tyne : Cambridge Scholars Publishing, 2014.
Rating:
Rzevski, G. (George), author.
Boston : WIT Press : WIT Press, [2018]
Rating:
New York : Nova Science Publishers, Inc., [2017]
Rating:
Ivancevic, Vladimir G., author.
New Jersey : World Scientific, [2015]
Rating:
Espinosa Salazar, Angela Ma. (Angela María)
London : Imperial College Press, [2011]
Rating:
Weidlich, Wolfgang, 1931-
Berlin ; New York : Springer-Verlag, 1983.
Rating:
Casti, J. L.
Chichester [Eng.] ; New York : J. Wiley, [1979]
Rating:
Beyer, Hugh.
San Francisco, Calif. : Morgan Kaufmann, [1998]
Rating:
Holtzblatt, Karen, author.
Amsterdam : Morgan Kaufmann, [2017]
Second edition.
Rating:
Brewer, John W. (John William)
Englewood Cliffs, N.J. : Prentice-Hall, [1974]
Rating:
Avetisyan, Ara S., author.
Newcastle upon Tyne : Cambridge Scholars Publishing, 2018.
Rating:
Howe, D. R. (David R.)
Oxford ; Boston : Butterworth Heinemann, 2001.
3rd ed.
Rating:
Caldarelli, Guido, author.
Oxford, United Kingdom ; New York, NY : Oxford University Press, 2016.
First edition.
Rating:
Theakanath, Thomas Kurian, author.
Birmingham : Packt Publishing, 2021.
Rating:
Siljak, Dragoslav D.
Boston : Academic Press, [1991]
Rating:
Martin, James, 1933-2013.
Englewood Cliffs, N.J. : Prentice-Hall, [1985]
Rating:
West, Bruce J.
Singapore ; Hackensack, NJ : World Scientific, [2010]
Rating:
Poulton, Nigel (Telecommunications engineer), author.
[Germany] : Nigel Poulton, 2018.
New edition.
Rating:
Howard, Ronald A.
New York : Wiley, [1971]
Rating:
Kashyap, Rangasami L. (Rangasami Laksminarayana), 1938-
New York : Academic Press, 1976.
Rating:
Kashyap, Rangasami L. (Rangasami Laksminarayana), 1938-
New York : Academic Press, 1976.
Rating:
Goodwin, Graham C. (Graham Clifford), 1945-
New York : Academic Press, 1977.
Rating:
Barrat, Alain, 1971- author.
Cambridge, UK : Cambridge University Press, 2008.
Rating:
Milstein, Mike M.
Boston : Allyn and Bacon, [1973]
Rating:
Van Dusseldorp, Ralph A.
Boston : Allyn and Bacon, [1971]
Rating:
Chin, Cheng Cheng.
Stevenage : IET, 2018.
Rating:
Manrubia, Susanna C.
River Edge, NJ : World Scientific, [2004]
Rating:
Boulder, Colo. : Published by Westview Press for the American Association for the Advancement of Science, 1978.
Rating:
Mize, Joe H.
Englewood Cliffs, N. J. : Prentice-Hall, 1968.
Rating:
Save Marked Records
