Technical writing.
Suffolk, UK : Professional and Higher Partnership, 2014.
Rating:
Lassen, Inger, 1951-
Amsterdam ; Philadelphia, PA : J. Benjamins Pub. Co., [2003]
Rating:
Amsterdam ; Philadelphia : J. Benjamins Pub. Co., [2000]
Rating:
Ebel, Hans Friedrich.
Weinheim : Wiley-VCH, [2004]
2nd, completely rev. ed.
Rating:
Ehrlich, Eugene, 1922-2008.
New York : Crowell, [1964]
Rating:
Weisman, Herman M.
Columbus, Ohio : C.E. Merrill Books, [1962]
Rating:
Gaast, Koen van der.
Amsterdam : Amsterdam University Press, 2020.
Rating:
Schoenfeld, Robert.
Weinheim, Federal Republic of Germany : VCH Verlagsgesellschaft ; New York, NY : Distribution, USA and Canada, VCH Publishers, [1986]
2nd, rev. ed.
Rating:
Miller, Jane E. (Jane Elizabeth), 1959-
Chicago : University of Chicago Press, 2005.
Rating:
Miller, Jane E. (Jane Elizabeth), 1959-
Chicago : University of Chicago Press, [2004]
Rating:
Booth, Vernon.
Cambridge [England] ; New York, NY, USA : Cambridge University Press, 1993.
2nd ed.
Rating:
Foster, David H., author.
Oxford, United Kingdom : Oxford University Press, 2017.
First edition.
Rating:
Urbana, Ill. : National Council of Teachers of English, [1981]
Rating:
Moore Stacks
T11 .C68 c.780
Available
---
Booth, Wayne C.
Chicago : University of Chicago Press, [2008]
3rd ed.
Rating:
Booth, Wayne C., author.
Chicago : The University of Chicago Press, 2016.
Fourth edition.
Rating:
Moore Reserves (Circulation Desk)
TEXTBOOK CMP 125
Available
Ask at Circulation Desk
Alley, Michael.
New York : Springer, 1998.
3rd ed. and corrected 3rd printing.
Rating:
Steiner, Felix.
Tübingen : Niemeyer, 2009.
Rating:
Casarín, Marcelo.
Córdoba : Universidad Nacional de Córdoba., 2020.
Rating:
Livnat, Zohar.
Amsterdam ; Philadelphia : John Benjamins Pub. Co., [2012]
Rating:
Valiela, Ivan.
Oxford ; New York : Oxford University Press, 2001.
Rating:
Valiela, Ivan.
Oxford ; New York : Oxford Univ. Press, [2001]
Rating:
Van Duyn, J. A., 1920-
New York : Wiley, [1982]
Rating:
Mkandawire, Martin.
New York : Nova Science Publishers, [2010]
Rating:
Weiss, Edmond H.
Abingdon, Oxon : Routledge, 2015.
Rating:
Zall, Paul M.
New York : Harper, 1962.
Rating:
Budinski, Kenneth G.
Materials Park, OH : ASM International, 2001.
Rating:
Moreno Castrillón, Francisco, author.
Barranquilla : Universidad del Norte, 2018.
Rating:
Sprent, Peter.
London ; New York : E & FN Spon, 1995.
1st ed.
Rating:
Washington, DC : National Academies Press, [2011]
Rating:
Crouch, W. George, 1903-1970.
New York : Ronald Press Co., [1964]
3d ed.
Rating:
Gilpin, Andrea A., 1969-
Toronto, Ont. : University of Toronto Press, 2000.
Rating:
Berlin ; Boston : De Gruyter Mouton, [2012]
Rating:
Hyland, Ken.
Amsterdam ; Philadelphia : John Benjamins Pub. Co., 1998.
Rating:
Russey, William E.
Weinheim : Wiley-VCH, 2006.
Rating:
Day, Robert A., 1924-2021.
Phoenix : Oryx Press, 1988.
3rd ed.
Rating:
Day, Robert A., 1924-2021.
Westport, Conn. : Greenwood Press, 2006.
6th ed.
Rating:
Michaelson, Herbert B. (Herbert Bernard), 1916-
Philadelphia : ISI Press, [1982]
Rating:
Trelease, Sam F. (Sam Farlow), 1892-
Cambridge, Mass. : M.I.T. Press, [1969]
Rating:
Trelease, Sam F. (Sam Farlow), 1892-
Baltimore : Williams & Wilkins, 1958.
Rating:
Meredith, Patrick.
Oxford ; New York : Pergamon Press, [1966]
[1st ed.]
Rating:
Netz, Reviel.
Cambridge ; New York : Cambridge University Press, 2009.
Rating:
Northey, Margot, 1940-
Don Mills, Ont. : Oxford University Press, [2007]
2nd ed.
Rating:
Baake, Ken.
Albany : State University of New York Press, [2003]
Rating:
Yuni, José, author.
Córdoba, Argentina : Editorial Brujas, [2020]
Rating:
Sherman, Theodore Allison.
New York : Prentice-Hall, 1955.
Rating:
Ward, Ritchie R.
New York : Knopf, [1968]
Rating:
Brusaw, Charles T.
Boston : Allyn and Bacon, [1973]
Rating:
Hays, Robert William, 1925-
Reading, Mass. : Addison-Wesley, [1965]
Rating:
Morris, M. D. (Morton Dan)
New York : Momentum Press, 2009.
1st ed.
Rating:
Willoughby, Cerys, author.
London : Royal Society of Chemistry, [2019]
Rating:
Save Marked Records
