LEADER 00000cam a2200589Ia 4500 
001    ocn228292434 
003    OCoLC 
005    20160527041739.6 
006    m     o  d         
007    cr cnu---unuuu 
008    080519s2007    maua    ob    001 0 eng d 
019    290537586|a471135823|a475404007|a475615103|a567967770
       |a648366990|a722650416|a728035893 
020    9781580537100|q(electronic book) 
020    1580537103|q(electronic book) 
020    |z158053709X 
020    |z9781580537094 
035    (OCoLC)228292434|z(OCoLC)290537586|z(OCoLC)471135823
       |z(OCoLC)475404007|z(OCoLC)475615103|z(OCoLC)567967770
       |z(OCoLC)648366990|z(OCoLC)722650416|z(OCoLC)728035893 
040    N$T|beng|epn|cN$T|dOCLCQ|dCOCUF|dCOO|dQE2|dOCLCQ|dOCLCA
       |dB24X7|dOCLCQ|dE7B|dOCLCO|dOCLCA|dP4I|dOCLCQ|dCLL|dCCO
       |dDKDLA|dFVL|dYDXCP|dOCLCQ 
049    RIDW 
050  4 TK7895.E42|bK45 2007eb 
072  7 TEC|x008020|2bisacsh 
072  7 TEC|x008010|2bisacsh 
082 04 621.3815|222 
090    TK7895.E42|bK45 2007eb 
100 1  Kelly, Joe,|cPh. D.|0https://id.loc.gov/authorities/names/
       nb2006028255 
245 10 Advanced production testing of RF, SoC, and SiP devices /
       |cJoe Kelly, Michael Engelhardt. 
264  1 Boston :|bArtech House,|c[2007] 
264  4 |c©2007 
300    1 online resource (xx, 301 pages) :|billustrations. 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
340    |gpolychrome|2rdacc 
347    text file|2rdaft 
490 1  Artech House microwave library 
504    Includes bibliographical references and index. 
588 0  Print version record. 
590    eBooks on EBSCOhost|bEBSCO eBook Subscription Academic 
       Collection - North America 
650  0 Systems on a chip|0https://id.loc.gov/authorities/subjects
       /sh2002000568|xTesting.|0https://id.loc.gov/authorities/
       subjects/sh99005648 
650  7 Systems on a chip.|2fast|0https://id.worldcat.org/fast/
       1141473 
650  7 Testing.|2fast|0https://id.worldcat.org/fast/1148240 
655  4 Electronic books. 
700 1  Engelhardt, M.|q(Michael)|0https://id.loc.gov/authorities/
       names/nr88004022 
776 08 |iPrint version:|aKelly, Joe.|tAdvanced production testing
       of RF, SoC, and SiP devices.|dBoston : Artech House, ©2007
       |z158053709X|z9781580537094|w(DLC)  2007272451
       |w(OCoLC)76944927 
830  0 Artech House microwave library.|0https://id.loc.gov/
       authorities/names/n42002465 
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
       search.ebscohost.com/login.aspx?direct=true&scope=site&
       db=nlebk&AN=225173|zOnline eBook. Access restricted to 
       current Rider University students, faculty, and staff. 
856 42 |3Instructions for reading/downloading this eBook|uhttp://
       guides.rider.edu/ebooks/ebsco 
901    MARCIVE 20231220 
948    |d201606016|cEBSCO|tebscoebooksacademic|lridw 
994    92|bRID