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BestsellerE-book
Author Bahukudumbi, Sudarshan.

Title Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

Publication Info. Boston : Artech House, 2010.

Item Status

Description 1 online resource (xv, 198 pages) : illustrations.
Physical Medium polychrome
Description text file
Series Artech House integrated microsystems series
Artech House integrated microsystems series.
Bibliography Includes bibliographical references and index.
Summary Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Integrated circuits -- Testing.
Integrated circuits -- Testing.
Integrated circuits -- Wafer-scale integration.
Integrated circuits -- Wafer-scale integration.
Semiconductors -- Testing.
Semiconductors -- Testing.
Genre/Form Electronic books.
Electronic books.
Added Author Chakrabarty, Krishnendu.
Other Form: Print version: Bahukudumbi, Sudarshan. Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty. Boston : Artech House, 2010 1596939893 (DLC) 2010455090 (OCoLC)449516460
ISBN 9781596939905 (electronic book)
1596939907 (electronic book)
1596939893
9781596939899