LEADER 00000cam a22006257i 4500
001 on1151184663
003 OCoLC
005 20211008041809.0
006 m o d
007 cr cn|||||||||
008 200502s2020 mau ob 001 0 eng d
019 1151504343|a1153998532|a1179922080
020 9781630815899|qelectronic book
020 1630815896|qelectronic book
020 |z9781630815882
020 |z1630815888
035 (OCoLC)1151184663|z(OCoLC)1151504343|z(OCoLC)1153998532
|z(OCoLC)1179922080
040 EBLCP|beng|erda|epn|cEBLCP|dCUV|dN$T|dOCLCO|dOCLCF|dUKAHL
|dYDX
049 RIDW
050 4 TK7867.2|b.G57 2020
082 04 621.382/24|223
090 TK7867.2|b.G57 2020
100 1 Giri, D. V.,|eauthor.
245 10 High-power radio frequency effects on electronic systems /
|cD.V. Giri, Richard Hoad, Frank Sabath.
264 1 Norwood, MA|bArtech House|c[2020]
300 1 online resource.
336 text|btxt|2rdacontent
337 computer|bc|2rdamedia
338 online resource|bcr|2rdacarrier
340 |gpolychrome|2rdacc
347 text file|2rdaft
490 1 Artech House electromagnetics series
504 Includes bibliographical references and index.
505 0 High-Power Electromagnetic Effects on Electronic Systems -
- Contents -- Foreword -- Acknowledgments -- 1
Introduction -- 1.1 Reliance on Electronics -- 1.2 HPEM
Environment Overview -- 1.3 HPEM Effects Overview -- 1.4 A
Brief History of EM Interference and Effects -- 1.5 A
Systems-of-Systems Hierarchy -- 1.5.1 Device -- 1.5.2
Circuit -- 1.5.3 Equipment -- 1.5.4 System -- 1.5.5
Network -- 1.5.6 Infrastructure -- 1.6 Summary --
References -- 2 HPEM Environments -- 2.1 Introduction --
2.2 Lightning -- 2.2.1 Overview -- 2.2.2 Lightning-
Radiated Environment -- 2.3 Nuclear EM Pulse
505 8 2.3.1 HEMP-Radiated Environment -- 2.3.2 HEMP-Conducted
Environment -- 2.3.3 Open-Source Accounts of HEMP
Disturbances -- 2.3.4 HEMP Environment Summary -- 2.4 High
-Power RF Directed Energy Environments -- 2.4.1 The Status
of HPRF DE Systems Today -- 2.5 Intentional EM
Interference Environments -- 2.5.1 IEMI Technical
Capability Groups -- 2.5.2 IEMI Environment Summary --
2.5.3 Open-Source Accounts of HPRF DE and IEMI Action --
2.6 Classification of HPRF DE and IEMI Environments --
2.6.1 Hypoband -- 2.6.2 Mesoband -- 2.6.3 Hyperband -- 2.7
Summary -- References -- 3 HPEM Coupling and Interaction
505 8 3.1 EM Interaction Coupling Model -- 3.2 Topological
Concept -- 3.3 Transfer Functions -- 3.3.1 Antenna
Transfer Function -- 3.3.2 Free-Space Wave Propagation --
3.3.3 Coupling/Radiation Efficiency -- 3.3.4 Diffusion
Penetration -- 3.3.5 Aperture Penetration -- 3.3.6
Conducted Propagation -- 3.3.7 Galvanic, Capacitive, and
Magnetic Coupling -- 3.3.8 Capacitive Coupling -- 3.3.9
Inductive Coupling -- 3.4 Field Variation Inside System
Enclosure -- 3.5 Overall Response -- 3.5.1 Devices,
Equipment, Systems, Networks, and Infrastructure -- 3.5.2
Coupling as a Function of HPEM Environment Type
505 8 References -- 4 Overview of HPEM Test Facilities and
Techniques -- 4.1 Introduction -- 4.1.1 General
Considerations for the Scenario -- 4.1.2 General
Considerations for HPEM Environment Simulation -- 4.1.3
General Considerations of the SUT -- 4.1.4 Summary -- 4.2
Uncertainty in Effects Testing -- 4.3 HPEM Effects Test
Methods and Facilities -- 4.3.1 HPEM-Radiated Testing --
4.3.2 HPEM-Radiated Test Facilities and HPEM Environment
Simulation -- 4.3.3 Measuring the Radiated HPEM
Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM
Conducted Testing
505 8 4.3.6 Measuring the Conducted HPEM Environment -- 4.4
Exercising and Observing the SUT -- 4.5 Effects Data
Presentation -- 4.6 Other Practical Considerations for
HPEM Effects Testing -- 4.7 Summary -- References -- 5
HPEM Effects Mechanisms -- 5.1 Introduction -- 5.2
Terminology -- 5.2.1 About This Chapter -- 5.3 Device and
Circuit-Level Effects -- 5.3.1 Rectification -- 5.3.2
Noise -- 5.3.3 Interference or Jamming -- 5.3.4 Saturation
-- 5.3.5 Shift in Operating Point -- 5.3.6 False
Information -- 5.3.7 Transient Upset -- 5.3.8 Chaotic
Effects -- 5.3.9 Damage and Destruction
505 8 5.3.10 Published Device and Circuit-Level Effects Data
588 Description based on online resource; title from PDF title
page (viewed on June 12, 2020)
590 eBooks on EBSCOhost|bEBSCO eBook Subscription Academic
Collection - North America
650 0 Electromagnetic compatibility.|0https://id.loc.gov/
authorities/subjects/sh85042167
650 7 Electromagnetic compatibility.|2fast|0https://
id.worldcat.org/fast/906512
655 4 Electronic books.
700 1 Hoad, Richard,|0https://id.loc.gov/authorities/names/
nb2012001623|eauthor.
700 1 Sabath, Frank,|0https://id.loc.gov/authorities/names/
nb2007020396|eauthor.
776 08 |iPrint version:|aGiri, D. V.|tHigh-Power Electromagnetic
Effects on Electronic Systems|dNorwood : Artech House,
c2020|z9781630815882
830 0 Artech House electromagnetic analysis series.|0https://
id.loc.gov/authorities/names/n2002010185
856 40 |uhttps://rider.idm.oclc.org/login?url=https://
search.ebscohost.com/login.aspx?direct=true&scope=site&
db=nlebk&AN=2450271|zOnline ebook via EBSCO. Access
restricted to current Rider University students, faculty,
and staff.
856 42 |3Instructions for reading/downloading the EBSCO version
of this ebook|uhttp://guides.rider.edu/ebooks/ebsco
901 MARCIVE 20231220
948 |d20211213|cEBSCO|tEBSCOebooksacademic NEW Oct-Nov 5018
|lridw
994 92|bRID
