| Description |
1 online resource (xx, 389 pages) : illustrations. |
| Physical Medium |
polychrome |
| Description |
text file |
| Series |
Circuits, devices and systems series ; 19
|
|
IET circuits, devices and systems series ; 19.
|
| Note |
Title from title screen. |
| Bibliography |
Includes bibliographical references and index. |
| Summary |
Annotation This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. It contains eleven chapters by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students. |
| Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
| Subject |
Linear integrated circuits -- Testing.
|
|
Linear integrated circuits -- Testing. |
|
Linear integrated circuits. |
|
Mixed signal circuits -- Testing.
|
|
Mixed signal circuits -- Testing. |
|
Mixed signal circuits. |
|
Radio frequency integrated circuits -- Testing.
|
|
Radio frequency integrated circuits. |
|
Testing. |
| Genre/Form |
Electronic books.
|
| Added Author |
Sun, Yichuang, editor.
|
|
Institution of Engineering and Technology.
|
| Other Form: |
Print version: Test and diagnosis of analogue, mixed-signal and RF integrated circuits. London : Institution of Engineering and Technology, 2008 9780863417450 (OCoLC)180473599 |
| ISBN |
9780863419997 (electronic book) |
|
0863419992 (electronic book) |
|
9781615833153 (electronic book) |
|
1615833153 (electronic book) |
|
9780863417450 |
|
0863417450 |
|
