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Series Titles (1-6 of 6)
Materials Characterization And Analysis Collection
1
Bestseller
Auger electron spectroscopy : practical application to materials analysis and characterization of su
Wolstenholme, John, author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
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2
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A practical guide to transmission electron microscopy : fundamentals
Luo, Zhiping, author.
New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
First edition.
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3
Bestseller
A practical guide to transmission electron microscopy. Advanced microscopy
Luo, Zhiping, author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
First edition.
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4
Bestseller
Secondary ion mass spectrometry : applications for depth profiling and surface characterization
Stevie, F. A., author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
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5
Bestseller
Spectroscopic ellipsometry : practical application to thin film characterization
Tompkins, Harland G., author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
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6
Bestseller
X-ray fluorescence spectrometry and its applications to archaeology : an illustrated guide
Donais, Mary Kate, author.
New York, NY : Momentum Press, [2018]
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