Skip to content
You are not logged in |Login  
     
Limit search to available items
Series Titles (1-6 of 6)
Materials Characterization And Analysis Collection
1
Bestseller
BestsellerE-book
 

Auger electron spectroscopy : practical application to materials analysis and characterization of su


Wolstenholme, John, author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.

Rating:

Item Status

2
Bestseller
BestsellerE-book
 

A practical guide to transmission electron microscopy : fundamentals


Luo, Zhiping, author.
New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
First edition.

Rating:

Item Status

3
Bestseller
BestsellerE-book
 

A practical guide to transmission electron microscopy. Advanced microscopy


Luo, Zhiping, author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.
First edition.

Rating:

Item Status

4
Bestseller
BestsellerE-book
 

Secondary ion mass spectrometry : applications for depth profiling and surface characterization


Stevie, F. A., author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.

Rating:

Item Status

5
Bestseller
BestsellerE-book
 

Spectroscopic ellipsometry : practical application to thin film characterization


Tompkins, Harland G., author.
New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016.

Rating:

Item Status

6
Bestseller
BestsellerE-book
 

X-ray fluorescence spectrometry and its applications to archaeology : an illustrated guide


Donais, Mary Kate, author.
New York, NY : Momentum Press, [2018]

Rating:

Item Status

Resources
More Information