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Title Characterisation and control of defects in semiconductors / edited by Filip Tuomisto.

Publication Info. Stevenage : The Institution of Engineering and Technology, 2019.
©2019

Item Status

Description 1 online resource (596 pages).
text file
Series IET Materials, Circuits & Devices Series ; 45
Materials, circuits and devices series ; 45.
Summary The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation spectroscopy; first principles methods; microscopy; 3D atomic-scale studies; ion beam modification; and ion beam analysis and channelling.
Local Note eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject Ion implantation.
Ion implantation.
Magnetic resonance.
Magnetic resonance.
Semiconductor doping.
Semiconductor doping.
Semiconductors -- Materials.
Semiconductors -- Materials.
Silicon.
Silicon.
Indexed Term semiconductor defects
electrically active defects
point defect luminescence
vibrational spectroscopy
magnetic resonance methods
muons
positron annihilation spectroscopy
first principles methods
microscopy
3D atomic-scale studies
ion beam modification
ion beam analysis
channelling
silicon
elemental semiconductors
ion implantation
ion beam effects
semiconductor doping
Genre/Form Electronic books.
Added Author Tuomisto, Filip, editor.
Other Form: Ebook version : 9781785616563
Original 1785616552 9781785616556 (OCoLC)1091584905
ISBN 1785616560
9781785616563 (electronic book)
9781785616556
1785616552