Description |
1 online resource (596 pages). |
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text file |
Series |
IET Materials, Circuits & Devices Series ; 45
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Materials, circuits and devices series ; 45.
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Summary |
The following topics are dealt with: semiconductor defect control; semiconductor doping; ion beam effects; ion implantation; elemental semiconductors; silicon; electrically active defects; point defect luminescence; vibrational spectroscopy; magnetic resonance methods; muons; positron annihilation spectroscopy; first principles methods; microscopy; 3D atomic-scale studies; ion beam modification; and ion beam analysis and channelling. |
Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
Subject |
Ion implantation.
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Ion implantation. |
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Magnetic resonance.
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Magnetic resonance. |
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Semiconductor doping.
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Semiconductor doping. |
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Semiconductors -- Materials.
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Semiconductors -- Materials. |
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Silicon.
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Silicon. |
Indexed Term |
semiconductor defects |
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electrically active defects |
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point defect luminescence |
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vibrational spectroscopy |
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magnetic resonance methods |
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muons |
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positron annihilation spectroscopy |
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first principles methods |
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microscopy |
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3D atomic-scale studies |
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ion beam modification |
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ion beam analysis |
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channelling |
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silicon |
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elemental semiconductors |
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ion implantation |
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ion beam effects |
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semiconductor doping |
Genre/Form |
Electronic books.
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Added Author |
Tuomisto, Filip, editor.
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Other Form: |
Ebook version : 9781785616563 |
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Original 1785616552 9781785616556 (OCoLC)1091584905 |
ISBN |
1785616560 |
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9781785616563 (electronic book) |
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9781785616556 |
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1785616552 |
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