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Series Titles (1-4 of 4)
Oxford Series In Optical And Imaging Sciences
1 Bestseller Introduction to scanning tunneling microscopy Chen, C. Julian. New York : Oxford University Press, 1993. Rating: Electronic Resources More... Item Status
2 Bestseller Monte Carlo modeling for electron microscopy and microanalysis Joy, David C., 1943- New York : Oxford University Press, 1995. Rating: Electronic Resources More... Item Status
3 Bestseller Photographic sensitivity : theory and mechanisms Tani, Tadaaki. New York : Oxford University Press, 1995. Rating: Electronic Resources More... Item Status
4 Bestseller Scanning force microscopy : with applications to electric, magnetic, and atomic forces Sarid, Dror. New York : Oxford University Press, 1994. Rev. ed. Rating: Electronic Resources More... Item Status

Resources

Introduction to scanning tunneling microscopy