| Description |
1 online resource (xxii, 412 pages, 31 pages of plates) : illustrations. |
| Physical Medium |
polychrome |
| Description |
text file |
| Series |
Oxford series in optical and imaging sciences ; 4
|
|
Oxford series in optical and imaging sciences ; 4.
|
| Bibliography |
Includes bibliographical references (pages 383-404) and index. |
| Contents |
1. Overview. 1.1. The scanning tunneling microscope in a nutshell. 1.2. Tunneling: an elementary model. 1.3. Probing electronic structure at an atomic scale. 1.4. Spatially resolved tunneling spectroscopy. 1.5. Lateral resolution: Early theories. 1.6. Origin of atomic resolution in STM. 1.7. Tip-sample interaction effects. 1.8. Historical remarks -- 2. Atom-scale tunneling. 2.2. The perturbation approach. 2.3. The image force. 2.4. The Square-barrier problem. 2.5. The modified Bardeen approach. 2.6. Effect of image force on tunneling -- 3. Tunneling matrix elements. 3.2. Tip wavefunctions. 3.3. Green's function and tip wavefunctions. 3.4. The derivative rule: individual cases. 3.5. The derivative rule: general case. 3.6. An intuitive interpretation -- 4. Wavefunctions at surfaces. 4.1. Types of surface wavefunctions. 4.2. The jellium model. 4.3. Concept of surface states. 4.4. Field emission spectroscopy. 4.5. Photoemission studies. 4.6. Atom-beam diffraction. |
| Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
| Subject |
Scanning tunneling microscopy.
|
|
Scanning tunneling microscopy. |
| Indexed Term |
Microscopy |
| Genre/Form |
Electronic books.
|
| Other Form: |
Print version: Chen, C. Julian. Introduction to scanning tunneling microscopy. New York : Oxford University Press, 1993 9780195071504 (DLC) 92040047 (OCoLC)27035849 |
| ISBN |
9780198023562 (electronic book) |
|
0198023561 (electronic book) |
|
0195071506 |
|
9780195071504 |
|
